Jitae Kim

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Anyang-city, KR

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope capable of measuring samples having overh...
- Patent number 7,644,447
- Issue date Jan 5, 2010
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE WITH TILTED SAMPLE STAGE
- Publication number 20100017920
- Publication date Jan 21, 2010
- San-IL Park
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERH...
- Publication number 20090200462
- Publication date Aug 13, 2009
- Park Systems Corp.
- Sang-il PARK
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope capable of measuring samples having overh...
- Publication number 20080078932
- Publication date Apr 3, 2008
- PSIA Co, LTD
- Sang-il Park
- G01 - MEASURING TESTING