Jiunn-Fu Liu

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring delay time
- Patent number 7,246,019
- Issue date Jul 17, 2007
- United Microelectronics Corp.
- Shu-Hua Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor structure
- Patent number 7,057,873
- Issue date Jun 6, 2006
- United Microelectronics Corp.
- Yanan Mou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Input/output circuit with high input/output voltage tolerance
- Patent number 6,188,243
- Issue date Feb 13, 2001
- United Integrated Circuits Corp.
- Jiunn-Fu Liu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Input and output circuit with wide voltage tolerance
- Patent number 5,969,563
- Issue date Oct 19, 1999
- United Microelectronics Corp.
- Chian-Gauh Shih
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING DELAY TIME
- Publication number 20070027647
- Publication date Feb 1, 2007
- Shu-Hua Kuo
- G01 - MEASURING TESTING
Information Patent Application
CAPACITOR STRUCTURE
- Publication number 20060061934
- Publication date Mar 23, 2006
- Yanan Mou
- H01 - BASIC ELECTRIC ELEMENTS