Jiyou Fu

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for determining stochastic variation associated with desired...
- Patent number 12,085,863
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Jiyou Fu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining stochastic variation associated with desired...
- Patent number 11,669,019
- Issue date Jun 6, 2023
- ASML Netherlands B.V.
- Jiyou Fu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for spectroscopic beam profile metrology includin...
- Patent number 10,234,271
- Issue date Mar 19, 2019
- KLA-Tencor Corporation
- Jiyou Fu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spectroscopic beam profile overlay metrology
- Patent number 10,101,676
- Issue date Oct 16, 2018
- KLA-Tencor Corporation
- Jiyou Fu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems for spectroscopic beam profile metrology having...
- Patent number 10,072,921
- Issue date Sep 11, 2018
- KLA-Tencor Corporation
- Jiyou Fu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement systems having linked field and pupil signal detection
- Patent number 9,739,719
- Issue date Aug 22, 2017
- KLA-Tencor Corporation
- Jiyou Fu
- G01 - MEASURING TESTING
Information Patent Grant
Control by sample reflectivity
- Patent number 7,903,250
- Issue date Mar 8, 2011
- KLA-Tencor Corporation
- Fabio A. Faccini
- G01 - MEASURING TESTING
Information Patent Grant
Measuring overlay and profile asymmetry using symmetric and anti-sy...
- Patent number 7,277,172
- Issue date Oct 2, 2007
- KLA-Tencor Technologies, Corporation
- Daniel Kandel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE ANALYSIS BASED ON ADAPTIVE WEIGHTING OF TEMPLATE CONTOURS
- Publication number 20250182443
- Publication date Jun 5, 2025
- ASML NETHERLANDS B.V.
- Jiyou FU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY METROLOGY BASED ON TEMPLATE MATCHING WITH ADAPTIVE WEIGHTING
- Publication number 20250044710
- Publication date Feb 6, 2025
- ASML NETHERLANDS B.V.
- Jiyou FU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING STOCHASTIC VARIATION ASSOCIATED WITH DESIRED...
- Publication number 20230280659
- Publication date Sep 7, 2023
- ASML NETHERLANDS B.V.
- Jiyou FU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING STOCHASTIC VARIATION ASSOCIATED WITH DESIRED...
- Publication number 20220229375
- Publication date Jul 21, 2022
- ASML NETHERLANDS B.V.
- Jiyou FU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods And Systems For Spectroscopic Beam Profile Metrology
- Publication number 20180347961
- Publication date Dec 6, 2018
- KLA-Tencor Corporation
- Jiyou Fu
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic Beam Profile Overlay Metrology
- Publication number 20170082932
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Jiyou Fu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spectroscopic Beam Profile Metrology
- Publication number 20160161245
- Publication date Jun 9, 2016
- KLA-Tencor Corporation
- Jiyou Fu
- G01 - MEASURING TESTING
Information Patent Application
Measurement Systems Having Linked Field And Pupil Signal Detection
- Publication number 20160123894
- Publication date May 5, 2016
- KLA-Tencor Corporation
- Jiyou Fu
- G01 - MEASURING TESTING
Information Patent Application
Measuring overlay and profile asymmetry using symmetric and anti-sy...
- Publication number 20060274310
- Publication date Dec 7, 2006
- KLA-Tencor Technologies Corporation
- Daniel Kandel
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method for determining stochastic variation associated with desired...

Method for determining stochastic variation associated with desired...

Method and system for spectroscopic beam profile metrology includin...

Spectroscopic beam profile overlay metrology

Methods and systems for spectroscopic beam profile metrology having...

Measurement systems having linked field and pupil signal detection

Control by sample reflectivity

Measuring overlay and profile asymmetry using symmetric and anti-sy...

Patents Applicationslast 30 patents

IMAGE ANALYSIS BASED ON ADAPTIVE WEIGHTING OF TEMPLATE CONTOURS

OVERLAY METROLOGY BASED ON TEMPLATE MATCHING WITH ADAPTIVE WEIGHTING

METHOD FOR DETERMINING STOCHASTIC VARIATION ASSOCIATED WITH DESIRED...

METHOD FOR DETERMINING STOCHASTIC VARIATION ASSOCIATED WITH DESIRED...

Methods And Systems For Spectroscopic Beam Profile Metrology

Spectroscopic Beam Profile Overlay Metrology

Spectroscopic Beam Profile Metrology

Measurement Systems Having Linked Field And Pupil Signal Detection

Measuring overlay and profile asymmetry using symmetric and anti-sy...