J.K. Leong

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San Jose, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
Methods And Systems For Optical Surface Defect Material Characteriz...
- Publication number 20210010949
- Publication date Jan 14, 2021
- KLA Corporation
- Zhiwei Xu
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Defect Material Classification
- Publication number 20190212277
- Publication date Jul 11, 2019
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Defect Material Classification
- Publication number 20180188188
- Publication date Jul 5, 2018
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING