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Jo Lissen
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Kerkrade, NL
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last 30 patents
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Patent Grant
Sample analyzer and computer program product
Patent number
7,633,604
Issue date
Dec 15, 2009
Sysmex Corporation
Yoshiro Ikeuchi
G01 - MEASURING TESTING
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Patent Grant
Sample analyzer
Patent number
7,450,223
Issue date
Nov 11, 2008
Sysmex Corporation
Yoshiro Ikeuchi
G01 - MEASURING TESTING