Joachim Mohr

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Patents Grantslast 30 patents

Information Patent Grant
Method and arrangement for background compensation in material anal...
- Patent number 4,979,823
- Issue date Dec 25, 1990
- JENOPTIK JENA G.m.b.H.
- Joachim Mohr
- G01 - MEASURING TESTING
Information Patent Grant
Method for the simultaneous analysis of several elements
- Patent number 4,900,149
- Issue date Feb 13, 1990
- Jenoptik Jena G.m.b.H.
- Joachim Mohr
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for the positioning of ends of flexible light-conducting...
- Patent number 4,759,598
- Issue date Jul 26, 1988
- Jenoptik Jena G.m.b.H.
- Joachim Mohr
- G02 - OPTICS
Information Patent Grant
Optical system for spectral analysis devices
- Patent number 4,690,559
- Issue date Sep 1, 1987
- Jenoptik Jena G.m.b.H.
- Stefan Florek
- G01 - MEASURING TESTING