Joachim RITTER

Person

Loerrach, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor unit and method for detecting an encoder at a predefined pos...
- Patent number 10,317,479
- Issue date Jun 11, 2019
- TDK-MICRONAS GMBH
- Joachim Ritter
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for testing integrated circuits
- Patent number 10,161,997
- Issue date Dec 25, 2018
- TDK-MICRONAS GMBH
- Joachim Ritter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a magnetic field detector circuit and a magnet...
- Patent number 10,018,685
- Issue date Jul 10, 2018
- TDK-MICRONAS GMBH
- Thomas Kauter
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a signal path
- Patent number 9,739,845
- Issue date Aug 22, 2017
- TDK-MICRONAS GMBH
- David Muthers
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system
- Patent number 9,348,003
- Issue date May 24, 2016
- Micronas GmbH
- Joachim Ritter
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system
- Patent number 9,341,463
- Issue date May 17, 2016
- Micronas GmbH
- Joachim Ritter
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and measuring system
- Patent number 9,279,702
- Issue date Mar 8, 2016
- Micronas GmbH
- Joachim Ritter
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement, apparatus and process for the serial sending o...
- Patent number 8,594,225
- Issue date Nov 26, 2013
- Micronas GmbH
- Thilo Rubehn
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic sensor arrangement and method for controlling a monolith...
- Patent number 8,508,216
- Issue date Aug 13, 2013
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit for an asynchronous serial data transfer with a...
- Patent number 8,275,083
- Issue date Sep 25, 2012
- Micronas GmbH
- Joachim Ritter
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Memory device with data security in a processor
- Patent number 7,761,717
- Issue date Jul 20, 2010
- Trident Microsystems (Far East) Ltd.
- Peter Möller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit configuration with serial test interface or serial test ope...
- Patent number 7,761,756
- Issue date Jul 20, 2010
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR UNIT AND METHOD FOR DETECTING AN ENCODER AT A PREDEFINED POS...
- Publication number 20180038920
- Publication date Feb 8, 2018
- TDK - Micronas GmbH
- Joachim RITTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING A MAGNETIC FIELD DETECTOR CIRCUIT AND A MAGNET...
- Publication number 20170153297
- Publication date Jun 1, 2017
- Micronas GmbH
- Thomas KAUTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A SIGNAL PATH
- Publication number 20160097806
- Publication date Apr 7, 2016
- Micronas GmbH
- David MUTHERS
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR TESTING INTEGRATED CIRCUITS
- Publication number 20150369860
- Publication date Dec 24, 2015
- Micronas GmbH
- Joachim RITTER
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND MEASURING SYSTEM
- Publication number 20140197822
- Publication date Jul 17, 2014
- Micronas GmbH
- Joachim RITTER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM
- Publication number 20140197820
- Publication date Jul 17, 2014
- Micronas GmbH
- Joachim RITTER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM
- Publication number 20140197821
- Publication date Jul 17, 2014
- Micronas GmbH
- Joachim RITTER
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT ARRANGEMENT, APPARATUS AND PROCESS FOR THE SERIAL SENDING O...
- Publication number 20090252210
- Publication date Oct 8, 2009
- Thilo Rubehn
- G01 - MEASURING TESTING
Information Patent Application
Monolithic sensor arrangement and method for controlling a monolith...
- Publication number 20080278891
- Publication date Nov 13, 2008
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING
Information Patent Application
Circuit configuration with serial test interface or serial test ope...
- Publication number 20070294605
- Publication date Dec 20, 2007
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT FOR AN ASYNCHRONOUS SERIAL DATA TRANSFER WITH A...
- Publication number 20070189335
- Publication date Aug 16, 2007
- Joachim Ritter
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Interrupt-controller with prioity specification
- Publication number 20040054832
- Publication date Mar 18, 2004
- Joerg Franke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Interrupt- controller
- Publication number 20030172215
- Publication date Sep 11, 2003
- Jorg Franke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory device with data security in a processor
- Publication number 20030014653
- Publication date Jan 16, 2003
- Peter Moller
- G06 - COMPUTING CALCULATING COUNTING

Joachim RITTER

Person

Patents Grantslast 30 patents

Sensor unit and method for detecting an encoder at a predefined pos...

Arrangement for testing integrated circuits

Method for operating a magnetic field detector circuit and a magnet...

Method for testing a signal path

Measuring system

Measuring system

Circuit and measuring system

Circuit arrangement, apparatus and process for the serial sending o...

Monolithic sensor arrangement and method for controlling a monolith...

Integrated circuit for an asynchronous serial data transfer with a...

Memory device with data security in a processor

Circuit configuration with serial test interface or serial test ope...

Patents Applicationslast 30 patents

SENSOR UNIT AND METHOD FOR DETECTING AN ENCODER AT A PREDEFINED POS...

METHOD FOR OPERATING A MAGNETIC FIELD DETECTOR CIRCUIT AND A MAGNET...

METHOD FOR TESTING A SIGNAL PATH

ARRANGEMENT FOR TESTING INTEGRATED CIRCUITS

CIRCUIT AND MEASURING SYSTEM

MEASURING SYSTEM

MEASURING SYSTEM

CIRCUIT ARRANGEMENT, APPARATUS AND PROCESS FOR THE SERIAL SENDING O...

Monolithic sensor arrangement and method for controlling a monolith...

Circuit configuration with serial test interface or serial test ope...

INTEGRATED CIRCUIT FOR AN ASYNCHRONOUS SERIAL DATA TRANSFER WITH A...

Interrupt-controller with prioity specification

Interrupt- controller

Memory device with data security in a processor