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Joachim Zach

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  • Osteringen, DE
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Corrector
    • Publication number 20120193533
    • Publication date Aug 2, 2012
    • Joachim Zach
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Corrector
    • Publication number 20120153147
    • Publication date Jun 21, 2012
    • Joachim Zach
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method
    • Publication number 20100213369
    • Publication date Aug 26, 2010
    • Joachim Zach
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Phase Plate, Imaging Method, and Electron Microscope
    • Publication number 20100001183
    • Publication date Jan 7, 2010
    • Joachim Zach
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Corrector for axial and off-axial beam paths
    • Publication number 20090146056
    • Publication date Jun 11, 2009
    • CEOS Corrected Electron Optical Systems GmbH
    • Joachim Zach
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Corrector
    • Publication number 20090101818
    • Publication date Apr 23, 2009
    • CEOS Corrected Electron Optical Systems GmbH
    • Joachim Zach
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Multipole coils
    • Publication number 20090084975
    • Publication date Apr 2, 2009
    • CEOS Corrected Electron Optical Systems GmbH
    • Joachim Zach
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Multipole coils
    • Publication number 20090079531
    • Publication date Mar 26, 2009
    • CEOS Corrected Electron Optical Systems GmbH
    • Joachim Zach
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Method and apparatus for automatically correcting charged-particle...
    • Publication number 20060169895
    • Publication date Aug 3, 2006
    • JEOL Ltd.
    • Kazuhiro Honda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Automated method of correcting aberrations in electron beam, method...
    • Publication number 20050247884
    • Publication date Nov 10, 2005
    • JEOL Ltd.
    • Natsuko Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Multipole lens, charged-particle beam instrument fitted with multip...
    • Publication number 20050029466
    • Publication date Feb 10, 2005
    • JEOL Ltd.
    • Eiji Kawai
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method for detecting geometrical-optical abberations
    • Publication number 20030001102
    • Publication date Jan 2, 2003
    • Joachim Zach
    • H01 - BASIC ELECTRIC ELEMENTS