Joanna Schmit

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Side illumination in interferometry
- Patent number 9,746,315
- Issue date Aug 29, 2017
- Bruker Nano Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Signal sectioning for profiling printed-circuit-bord vias with vert...
- Patent number 9,664,509
- Issue date May 30, 2017
- Bruker Nano Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Optical plate for calibration of coordinate measuring machines
- Patent number 9,372,079
- Issue date Jun 21, 2016
- Tay-Chang Wu
- G01 - MEASURING TESTING
Information Patent Grant
Full-color images produced by white-light interferometry
- Patent number 9,282,304
- Issue date Mar 8, 2016
- Bruker Nano Inc.
- Joanna Schmit
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal sectioning for profiling printed-circuit-board vias with ver...
- Patent number 8,953,171
- Issue date Feb 10, 2015
- Bruker Nano Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Large-surface defect detection by single-frame spatial-carrier inte...
- Patent number 8,275,573
- Issue date Sep 25, 2012
- Bruker Nano, Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Polarization mirau interference microscope
- Patent number 8,072,610
- Issue date Dec 6, 2011
- Bruker Nano, Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric iterative technique with bandwidth and numerical-ap...
- Patent number 7,505,863
- Issue date Mar 17, 2009
- Veeco Instruments, Inc.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of object deformation with optical profiler
- Patent number 7,283,250
- Issue date Oct 16, 2007
- Veeco Instruments, Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness and boundary characterization by interferometric pro...
- Patent number 7,119,909
- Issue date Oct 10, 2006
- Veeco Instruments, Inc.
- Paul R. Unruh
- G01 - MEASURING TESTING
Information Patent Grant
Reference signal for stitching of interferometric profiles
- Patent number 6,987,570
- Issue date Jan 17, 2006
- Veeco Instruments Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Alignment and correction template for optical profilometric measure...
- Patent number 6,847,460
- Issue date Jan 25, 2005
- Veeco Instruments, Inc.
- Colin T. Farrell
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning interferometry with reference signal
- Patent number 6,624,894
- Issue date Sep 23, 2003
- Veeco Instruments Inc.
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Correction of scanning errors in interferometric profiling
- Patent number 6,624,893
- Issue date Sep 23, 2003
- Veeco Instruments Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Bat-wing attenuation in white-light interferometry
- Patent number 6,493,093
- Issue date Dec 10, 2002
- Veeco Instruments Inc.
- Akiko Harasaki
- G01 - MEASURING TESTING
Information Patent Grant
Selection process for sequentially combining multiple sets of overl...
- Patent number 5,991,461
- Issue date Nov 23, 1999
- Veeco Corporation
- Mark A. Schmucker
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL SECTIONING FOR PROFILING PRINTED-CIRCUIT-BORD VIAS WITH VERT...
- Publication number 20150103357
- Publication date Apr 16, 2015
- JOANNA SCHMIT
- G01 - MEASURING TESTING
Information Patent Application
Interferometric iterative technique with bandwidth and numerical-ap...
- Publication number 20090018786
- Publication date Jan 15, 2009
- VEECO INSTRUMENTS, INC.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Application
Film thickness and boundary characterization by interferometric pro...
- Publication number 20050280829
- Publication date Dec 22, 2005
- Paul R. Unruh
- G01 - MEASURING TESTING
Information Patent Application
Measurement of object deformation with optical profiler
- Publication number 20050157306
- Publication date Jul 21, 2005
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Application
Alignment and correction template for optical profilometric measure...
- Publication number 20030035115
- Publication date Feb 20, 2003
- Colin T. Farrell
- G11 - INFORMATION STORAGE
Information Patent Application
Scanning interferometry with reference signal
- Publication number 20020196450
- Publication date Dec 26, 2002
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Application
BAT-WING ATTENUATION IN WHITE-LIGHT INTERFEROMETRY
- Publication number 20020149781
- Publication date Oct 17, 2002
- Akiko Harasaki
- G01 - MEASURING TESTING

Joanna Schmit

Person

Patents Grantslast 30 patents

Side illumination in interferometry

Signal sectioning for profiling printed-circuit-bord vias with vert...

Optical plate for calibration of coordinate measuring machines

Full-color images produced by white-light interferometry

Signal sectioning for profiling printed-circuit-board vias with ver...

Large-surface defect detection by single-frame spatial-carrier inte...

Polarization mirau interference microscope

Interferometric iterative technique with bandwidth and numerical-ap...

Measurement of object deformation with optical profiler

Film thickness and boundary characterization by interferometric pro...

Reference signal for stitching of interferometric profiles

Alignment and correction template for optical profilometric measure...

Scanning interferometry with reference signal

Correction of scanning errors in interferometric profiling

Bat-wing attenuation in white-light interferometry

Selection process for sequentially combining multiple sets of overl...

Patents Applicationslast 30 patents

SIGNAL SECTIONING FOR PROFILING PRINTED-CIRCUIT-BORD VIAS WITH VERT...

Interferometric iterative technique with bandwidth and numerical-ap...

Film thickness and boundary characterization by interferometric pro...

Measurement of object deformation with optical profiler

Alignment and correction template for optical profilometric measure...

Scanning interferometry with reference signal

BAT-WING ATTENUATION IN WHITE-LIGHT INTERFEROMETRY