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Joannes Jitse VENSELAAR
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s-Hertogenbosch, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Method of determining information about a patterning process, metho...
Patent number
11,604,419
Issue date
Mar 14, 2023
ASML Netherlands B.V.
Joannes Jitse Venselaar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of determining information about a patterning process, metho...
Patent number
11,022,897
Issue date
Jun 1, 2021
ASML Netherlands B.V.
Joannes Jitse Venselaar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of determining a value of a parameter of interest of a targe...
Patent number
10,585,048
Issue date
Mar 10, 2020
ASML Netherlands B.V.
Samee Ur Rehman
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of optimizing a metrology process
Patent number
10,585,354
Issue date
Mar 10, 2020
ASML Netherlands B.V.
Anagnostis Tsiatmas
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
Publication number
20210255552
Publication date
Aug 19, 2021
ASML NETHERLANDS B.V.
Joannes Jitse VENSELAAR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A TARGE...
Publication number
20190323972
Publication date
Oct 24, 2019
ASML NETHERLANDS B.V.
Samee Ur REHMAN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF OPTIMIZING A METROLOGY PROCESS
Publication number
20190243253
Publication date
Aug 8, 2019
ASML NETHERLANDS B.V.
Anagnostis TSIATMAS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
Publication number
20190171115
Publication date
Jun 6, 2019
ASML NETHERLANDS B.V.
Joannes Jitse VENSELAAR
G06 - COMPUTING CALCULATING COUNTING