Jochem Sebastiaan Wildenberg

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 11,940,740
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for controlling a manufacturing process and associated appar...
- Patent number 11,796,920
- Issue date Oct 24, 2023
- ASML Netherlands B.V.
- Jochem Sebastiaan Wildenberg
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selecting a set of locations associated with a measurement or featu...
- Patent number 11,681,231
- Issue date Jun 20, 2023
- ASML Netherlands B.V.
- Pierluigi Frisco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for controlling a manufacturing apparatus and associated app...
- Patent number 11,669,017
- Issue date Jun 6, 2023
- ASML Netherlands B.V.
- Roy Werkman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for optimization of a lithographic process
- Patent number 11,480,884
- Issue date Oct 25, 2022
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimizing a sequence of processes for manufacturing of product units
- Patent number 11,442,367
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Jochem Sebastiaan Wildenberg
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of determining a set of metrology points on a substrate, ass...
- Patent number 11,435,673
- Issue date Sep 6, 2022
- ASML Netherlands B.V.
- Kevin Van De Ruit
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 11,385,550
- Issue date Jul 12, 2022
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining contribution to a fingerprint
- Patent number 11,378,891
- Issue date Jul 5, 2022
- ASML Netherlands B.V.
- Davit Harutyunyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimating a parameter of a substrate
- Patent number 11,327,406
- Issue date May 10, 2022
- ASML Netherlands B.V.
- Svetla Petrova Matova
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method to change an etch parameter
- Patent number 11,300,887
- Issue date Apr 12, 2022
- ASML Netherlands B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selecting a set of locations associated with a measurement or featu...
- Patent number 11,294,289
- Issue date Apr 5, 2022
- ASML Netherlands B.V.
- Pierluigi Frisco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 11,170,072
- Issue date Nov 9, 2021
- ASML Netherands B.V.
- Everhardus Cornelis Mos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing a sequence of processes for manufacturing of product units
- Patent number 11,106,141
- Issue date Aug 31, 2021
- ASML Netherlands B.V.
- Jochem Sebastiaan Wildenberg
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for characterizing distortions in a lithographic process, li...
- Patent number 10,928,737
- Issue date Feb 23, 2021
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining contribution to a fingerprint
- Patent number 10,816,904
- Issue date Oct 27, 2020
- ASML Netherlands B.V.
- Davit Harutyunyan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of monitoring and device manufacturing method
- Patent number 10,809,631
- Issue date Oct 20, 2020
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for optimization of a lithographic process
- Patent number 10,802,408
- Issue date Oct 13, 2020
- ASML Netherlands B.V.
- Everhardus Cornelis Mos
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for reticle optimization
- Patent number 10,725,372
- Issue date Jul 28, 2020
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 10,642,162
- Issue date May 5, 2020
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 10,274,834
- Issue date Apr 30, 2019
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 9,946,165
- Issue date Apr 17, 2018
- ASML Netherlands B.V.
- Alexander Ypma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining a measurement subset of metrology points on a...
- Patent number 9,811,006
- Issue date Nov 7, 2017
- ASML Netherlands B.V.
- Jochem Sebastiaan Wildenberg
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING A PERFORMANCE PARAMETER DISTRIBUTION
- Publication number 20240402618
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Vahid BASTANI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A METHOD FOR MODELING MEASUREMENT DATA OVER A SUBSTRATE AREA AND AS...
- Publication number 20240152059
- Publication date May 9, 2024
- ASML NETHERLANDS B.V.
- Dogacan KARA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF FITTING MEASUREMENT DATA TO A MODEL AND MODELING A PERFO...
- Publication number 20240118629
- Publication date Apr 11, 2024
- ASML NETHERLANDS B.V.
- Aliasghar KEYVANI JANBAHAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY METHODS AND APPARATUSES
- Publication number 20240061346
- Publication date Feb 22, 2024
- Thomas THEEUWES
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING AT LEAST A TARGET LAYOUT AND ASSOCIATED METRO...
- Publication number 20240036479
- Publication date Feb 1, 2024
- ASML NETHERLANDS B.V.
- Roy WERKMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...
- Publication number 20240019788
- Publication date Jan 18, 2024
- ASML NETHERLANDS B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND COMPUTER PROGRAMS FOR CONFIGURATION OF A SAMPLING SCHEM...
- Publication number 20230400778
- Publication date Dec 14, 2023
- ASML NETHERLANDS B.V.
- Roy WERKMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETERMINING A SAMPLING SCHEME, ASSOCIATED APPARATUS AND C...
- Publication number 20230141495
- Publication date May 11, 2023
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph CRAMER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING A MANUFACTURING PROCESS AND ASSOCIATED APPAR...
- Publication number 20230082858
- Publication date Mar 16, 2023
- ASML NETHERLANDS B.V.
- Jochem Sebastiaan WILDENBERG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING CONTROL DATA FOR A LITHOGRAPHI...
- Publication number 20220413391
- Publication date Dec 29, 2022
- ASML NETHERLANDS B.V.
- Michel Alphons Theodorus VAN HINSBERG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT
- Publication number 20220342319
- Publication date Oct 27, 2022
- ASML NETHERLANDS B.V.
- Davit Harutyunyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...
- Publication number 20220326623
- Publication date Oct 13, 2022
- ASML NETHERLANDS B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTING A SET OF LOCATIONS ASSOCIATED WITH A MEASUREMENT OR FEATU...
- Publication number 20220187714
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Pierluigi FRISCO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING A SET OF METROLOGY POINTS ON A SUBSTRATE, ASS...
- Publication number 20220155698
- Publication date May 19, 2022
- ASML NETHERLANDS B.V.
- Kevin VAN DE RUIT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20220027437
- Publication date Jan 27, 2022
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS
- Publication number 20210389684
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Jochem Sebastiaan Wildenberg
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ESTIMATING A PARAMETER OF A SUBSTRATE
- Publication number 20210271171
- Publication date Sep 2, 2021
- ASML NETHERLANDS B.V.
- Svetla Petrova MATOVA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT
- Publication number 20210003927
- Publication date Jan 7, 2021
- ASML NETHERLANDS B.V.
- Davit Harutyunyan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR OPTIMIZATION OF A LITHOGRAPHIC PROCESS
- Publication number 20200356012
- Publication date Nov 12, 2020
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING A MANUFACTURING APPARATUS AND ASSOCIATED APP...
- Publication number 20200278614
- Publication date Sep 3, 2020
- ASML NETHERLANDS B.V.
- Roy WERKMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS & APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING T...
- Publication number 20200264520
- Publication date Aug 20, 2020
- ASML NETHERLANDS B.V.
- Alexander YPMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS
- Publication number 20200026200
- Publication date Jan 23, 2020
- ASML NETHERLANDS B.V.
- Jochem Sebastiaan WILDENBERG
- G05 - CONTROLLING REGULATING
Information Patent Application
A METHOD FOR OPTIMIZATION OF A LITHOGRAPHIC PROCESS
- Publication number 20190317412
- Publication date Oct 17, 2019
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A PROCESSING APPARATUS AND A METHOD FOR CORRECTING A PARAMETER VARI...
- Publication number 20190311921
- Publication date Oct 10, 2019
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A METHOD TO CHANGE AN ETCH PARAMETER
- Publication number 20190285992
- Publication date Sep 19, 2019
- ASML NETHERLANDS B.V.
- Richard Johannes Franciscus VAN HAREN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...
- Publication number 20190278188
- Publication date Sep 12, 2019
- ASML NETHERLANDS B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT
- Publication number 20190271919
- Publication date Sep 5, 2019
- ASML NETHERLANDS B.V.
- Davit HARUTYUNYAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SELECTING A SET OF LOCATIONS ASSOCIATED WITH A MEASUREMENT OR FEATU...
- Publication number 20190243252
- Publication date Aug 8, 2019
- ASML NETHERLANDS B.V.
- Pierluigi FRISCO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CHARACTERIZING DISTORTIONS IN A LITHOGRAPHIC PROCESS, LI...
- Publication number 20190011842
- Publication date Jan 10, 2019
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MONITORING AND DEVICE MANUFACTURING METHOD
- Publication number 20180307145
- Publication date Oct 25, 2018
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Jochem Sebastiaan Wildenberg

Person

Patents Grantslast 30 patents

Methods and apparatus for obtaining diagnostic information relating...

Method for controlling a manufacturing process and associated appar...

Selecting a set of locations associated with a measurement or featu...

Method for controlling a manufacturing apparatus and associated app...

Method for optimization of a lithographic process

Optimizing a sequence of processes for manufacturing of product units

Method of determining a set of metrology points on a substrate, ass...

Methods and apparatus for obtaining diagnostic information relating...

Method for determining contribution to a fingerprint

Estimating a parameter of a substrate

Method to change an etch parameter

Selecting a set of locations associated with a measurement or featu...

Method and apparatus for inspection and metrology

Optimizing a sequence of processes for manufacturing of product units

Method for characterizing distortions in a lithographic process, li...

Method for determining contribution to a fingerprint

Method of monitoring and device manufacturing method

Method for optimization of a lithographic process

Method and apparatus for reticle optimization

Methods and apparatus for obtaining diagnostic information relating...

Methods and apparatus for obtaining diagnostic information relating...

Methods and apparatus for obtaining diagnostic information relating...

Method of determining a measurement subset of metrology points on a...

Patents Applicationslast 30 patents

METHOD OF DETERMINING A PERFORMANCE PARAMETER DISTRIBUTION

A METHOD FOR MODELING MEASUREMENT DATA OVER A SUBSTRATE AREA AND AS...

METHODS OF FITTING MEASUREMENT DATA TO A MODEL AND MODELING A PERFO...

METROLOGY METHODS AND APPARATUSES

METHOD OF DETERMINING AT LEAST A TARGET LAYOUT AND ASSOCIATED METRO...

METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...

METHODS AND COMPUTER PROGRAMS FOR CONFIGURATION OF A SAMPLING SCHEM...

METHOD OF DETERMINING A SAMPLING SCHEME, ASSOCIATED APPARATUS AND C...

METHOD FOR CONTROLLING A MANUFACTURING PROCESS AND ASSOCIATED APPAR...

METHOD AND APPARATUS FOR DETERMINING CONTROL DATA FOR A LITHOGRAPHI...

METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT

METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...

SELECTING A SET OF LOCATIONS ASSOCIATED WITH A MEASUREMENT OR FEATU...

METHOD OF DETERMINING A SET OF METROLOGY POINTS ON A SUBSTRATE, ASS...

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS

ESTIMATING A PARAMETER OF A SUBSTRATE

METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT

METHOD FOR OPTIMIZATION OF A LITHOGRAPHIC PROCESS

METHOD FOR CONTROLLING A MANUFACTURING APPARATUS AND ASSOCIATED APP...

METHODS & APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING T...

OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS

A METHOD FOR OPTIMIZATION OF A LITHOGRAPHIC PROCESS

A PROCESSING APPARATUS AND A METHOD FOR CORRECTING A PARAMETER VARI...

A METHOD TO CHANGE AN ETCH PARAMETER

METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...

METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT

SELECTING A SET OF LOCATIONS ASSOCIATED WITH A MEASUREMENT OR FEATU...

METHOD FOR CHARACTERIZING DISTORTIONS IN A LITHOGRAPHIC PROCESS, LI...

METHOD OF MONITORING AND DEVICE MANUFACTURING METHOD