Jochen Kallscheuer

Person

Munchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor chips by means of bit masks
- Patent number 7,461,308
- Issue date Dec 2, 2008
- Infineon Technologies AG
- Jochen Kallscheuer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing semiconductor chips using register sets
- Patent number 7,454,676
- Issue date Nov 18, 2008
- Infineon Technologies AG
- Udo Hartmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory
- Patent number 7,283,419
- Issue date Oct 16, 2007
- Infineon Technologies, AG
- Fabien Funfrock
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing semiconductor chips
- Patent number 6,858,447
- Issue date Feb 22, 2005
- Infineon Technologies AG
- Udo Hartmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for on-chip testing of memory cells of an integrated memory...
- Patent number 6,728,147
- Issue date Apr 27, 2004
- Infineon Technologies AG
- Peter Beer
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES
- Publication number 20080231303
- Publication date Sep 25, 2008
- QIMONDA AG
- Jochen Kallscheuer
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for repairing memory chips using microlithog...
- Publication number 20070066367
- Publication date Mar 22, 2007
- Jochen Kallscheuer
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory
- Publication number 20060277379
- Publication date Dec 7, 2006
- Fabien Funfrock
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing semiconductor chips using check bits
- Publication number 20060156108
- Publication date Jul 13, 2006
- Patric Stracke
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor chips by means of bit masks
- Publication number 20060156107
- Publication date Jul 13, 2006
- Jochen Kallscheuer
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor chips using register sets
- Publication number 20060156110
- Publication date Jul 13, 2006
- Udo Hartmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing semiconductor chips
- Publication number 20030059962
- Publication date Mar 27, 2003
- Udo Hartmann
- G01 - MEASURING TESTING
Information Patent Application
Method for on-chip testing of memory cells of an integrated memory...
- Publication number 20030021169
- Publication date Jan 30, 2003
- Peter Beer
- G11 - INFORMATION STORAGE

Jochen Kallscheuer

Person

Patents Grantslast 30 patents

Method for testing semiconductor chips by means of bit masks

Method for testing semiconductor chips using register sets

Integrated semiconductor memory

Method for testing semiconductor chips

Method for on-chip testing of memory cells of an integrated memory...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES

Method and arrangement for repairing memory chips using microlithog...

Integrated semiconductor memory

Method for testing semiconductor chips using check bits

Method for testing semiconductor chips by means of bit masks

Method for testing semiconductor chips using register sets

Method for testing semiconductor chips

Method for on-chip testing of memory cells of an integrated memory...