Jochen Rivoir

Person

Maqstadt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Tester and method for testing a device under test using relevance s...
- Patent number 11,200,156
- Issue date Dec 14, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for combined signals
- Patent number 11,187,743
- Issue date Nov 30, 2021
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for performing a test on a device under test and dat...
- Patent number 11,182,274
- Issue date Nov 23, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and method for characterizing a device under test
- Patent number 11,036,623
- Issue date Jun 15, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and method for testing a device under test
- Patent number 10,775,437
- Issue date Sep 15, 2020
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for wireless testing of a plurality of transmi...
- Patent number 9,847,843
- Issue date Dec 19, 2017
- Advantest Corporation
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Techniques for determining a fault probability of a location on a chip
- Patent number 9,658,282
- Issue date May 23, 2017
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Bit sequence generator and apparatus for calculating a sub-rate tra...
- Patent number 9,575,726
- Issue date Feb 21, 2017
- Advantest Corporation
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device under test data processing techniques
- Patent number 9,341,673
- Issue date May 17, 2016
- Advantest Corporation
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for determining a number of successive equal bits precedi...
- Patent number 9,164,726
- Issue date Oct 20, 2015
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus comprising a recursive delayer and method for measuring a...
- Patent number 9,140,750
- Issue date Sep 22, 2015
- Advantest Corporation
- Marco Pausini
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adjusting transitions in a bit stream
- Patent number 9,103,887
- Issue date Aug 11, 2015
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Data processing unit and a method of processing data
- Patent number 8,886,987
- Issue date Nov 11, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
State machine and generator for generating a description of a state...
- Patent number 8,880,574
- Issue date Nov 4, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Re-configurable test circuit, method for operating an automated tes...
- Patent number 8,838,406
- Issue date Sep 16, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for estimating data relating to a time differe...
- Patent number 8,825,424
- Issue date Sep 2, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Grant
Method of sharing a test resource at a plurality of test sites, aut...
- Patent number 8,797,046
- Issue date Aug 5, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining relevance values for a detecti...
- Patent number 8,745,568
- Issue date Jun 3, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Format transformation of test data
- Patent number 8,418,010
- Issue date Apr 9, 2013
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G11 - INFORMATION STORAGE
Information Patent Grant
Evaluation of an output signal of a device under test
- Patent number 8,378,707
- Issue date Feb 19, 2013
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Decorrelation of data by using this data
- Patent number 8,253,605
- Issue date Aug 28, 2012
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Calibrating signals by time adjustment
- Patent number 8,169,212
- Issue date May 1, 2012
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Asynchronous sigma-delta digital-analog converter
- Patent number 7,847,716
- Issue date Dec 7, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Time-to-digital conversion with calibration pulse injection
- Patent number 7,791,525
- Issue date Sep 7, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Grant
Time-to-digital conversion with delay contribution determination of...
- Patent number 7,782,242
- Issue date Aug 24, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Grant
Analog signal test using a-priori information
- Patent number 7,672,804
- Issue date Mar 2, 2010
- Agilent Technologies, Inc.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Re-configurable architecture for automated test equipment
- Patent number 7,590,903
- Issue date Sep 15, 2009
- Verigy (Singapore) Pte. Ltd.
- Erik Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for per-pin clock synthesis of an electronic devi...
- Patent number 7,512,858
- Issue date Mar 31, 2009
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Parameterized signal conditioning
- Patent number 7,434,118
- Issue date Oct 7, 2008
- Verigy (Singapore) Pte. Ltd.
- Marc Moessinger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DEVICE TESTING TO AVOID RESOURCE CONFLICTS...
- Publication number 20220253375
- Publication date Aug 11, 2022
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS FOR PERFORMING A TEST ON A DEVICE UNDER TEST AND DAT...
- Publication number 20200019491
- Publication date Jan 16, 2020
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST USING RELEVANCE S...
- Publication number 20190377670
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...
- Publication number 20190377027
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND METHOD FOR CHARACTERIZING A DEVICE UNDER TEST
- Publication number 20190370158
- Publication date Dec 5, 2019
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED TEST EQUIPMENT FOR COMBINED SIGNALS
- Publication number 20180088172
- Publication date Mar 29, 2018
- Advantest Corporation
- ANDREAS HANTSCH
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20160334466
- Publication date Nov 17, 2016
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
BIT SEQUENCE GENERATOR AND APPARATUS FOR CALCULATING A SUB-RATE TRA...
- Publication number 20150268933
- Publication date Sep 24, 2015
- Advantest Pte. Ltd.
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device Under Test Data Processing Techniques
- Publication number 20150039927
- Publication date Feb 5, 2015
- ADVANTEST (SINGAPORE) PTE LTD
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Determining a Fault Probability of a Location on a Chip
- Publication number 20140336958
- Publication date Nov 13, 2014
- ADVANTEST (SINGAPORE) PTE LTD
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Reconfigurable Automatic Test Circuit Techniques
- Publication number 20140336974
- Publication date Nov 13, 2014
- ADVANTEST (SINGAPORE) PTE LTD
- Rivoir Jochen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETERMINING A NUMBER OF SUCCESSIVE EQUAL BITS PRECEDI...
- Publication number 20130198252
- Publication date Aug 1, 2013
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS COMPRISING A RECURSIVE DELAYER AND METHOD FOR MEASURING A...
- Publication number 20120256639
- Publication date Oct 11, 2012
- Marco Pausini
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMI...
- Publication number 20120232826
- Publication date Sep 13, 2012
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RE-CONFIGURABLE TEST CIRCUIT, METHOD FOR OPERATING AN AUTOMATED TES...
- Publication number 20110276302
- Publication date Nov 10, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
DECORRELATION OF DATA BY USING THIS DATA
- Publication number 20110254719
- Publication date Oct 20, 2011
- VERIGY (SINGAPORE) PTE. LTD.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STATE MACHINE AND GENERATOR FOR GENERATING A DESCRIPTION OF A STATE...
- Publication number 20110231464
- Publication date Sep 22, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING UNIT AND A METHOD OF PROCESSING DATA
- Publication number 20110197086
- Publication date Aug 11, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS AND METHOD FOR ESTIMATING DATA RELATING TO A TIME DIFFERE...
- Publication number 20110140737
- Publication date Jun 16, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Application
METHOD OF SHARING A TEST RESOURCE AT A PLURALITY OF TEST SITES, AUT...
- Publication number 20110041012
- Publication date Feb 17, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING RELEVANCE VALUES FOR A DETECTI...
- Publication number 20110032829
- Publication date Feb 10, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
ASYNCHRONOUS SIGMA-DELTA DIGITAL-ANALOG CONVERTER
- Publication number 20100045499
- Publication date Feb 25, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FORMAT TRANSFORMATION OF TEST DATA
- Publication number 20100011252
- Publication date Jan 14, 2010
- Verigy ( Singapore) Pte. Ltd.
- Jochen Rivoir
- G11 - INFORMATION STORAGE
Information Patent Application
TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF...
- Publication number 20090322574
- Publication date Dec 31, 2009
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Application
CALIBRATING SIGNALS BY TIME ADJUSTMENT
- Publication number 20090219010
- Publication date Sep 3, 2009
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Analog signal test using a-priori information
- Publication number 20090063100
- Publication date Mar 5, 2009
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Parameterized Signal Conditioning
- Publication number 20080208510
- Publication date Aug 28, 2008
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Application
Re-configurable architecture for automated test equipment
- Publication number 20070266288
- Publication date Nov 15, 2007
- Erik Volkerink
- G01 - MEASURING TESTING
Information Patent Application
Evaluation of an output signal of a device under test
- Publication number 20070150224
- Publication date Jun 28, 2007
- AGILENT TECHNOLOGIES, INC.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Jitter generation
- Publication number 20070126414
- Publication date Jun 7, 2007
- AGILENT TECHNOLOGIES, INC.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY

Jochen Rivoir

Person

Patents Grantslast 30 patents

Tester and method for testing a device under test using relevance s...

Automated test equipment for combined signals

Test apparatus for performing a test on a device under test and dat...

Tester and method for testing a device under test and tester and me...

Test apparatus and method for characterizing a device under test

Test apparatus and method for testing a device under test

Apparatus and method for wireless testing of a plurality of transmi...

Techniques for determining a fault probability of a location on a chip

Bit sequence generator and apparatus for calculating a sub-rate tra...

Device under test data processing techniques

Apparatus for determining a number of successive equal bits precedi...

Apparatus comprising a recursive delayer and method for measuring a...

Method and apparatus for adjusting transitions in a bit stream

Data processing unit and a method of processing data

State machine and generator for generating a description of a state...

Re-configurable test circuit, method for operating an automated tes...

Apparatus and method for estimating data relating to a time differe...

Method of sharing a test resource at a plurality of test sites, aut...

Method and apparatus for determining relevance values for a detecti...

Format transformation of test data

Evaluation of an output signal of a device under test

Decorrelation of data by using this data

Calibrating signals by time adjustment

Asynchronous sigma-delta digital-analog converter

Time-to-digital conversion with calibration pulse injection

Time-to-digital conversion with delay contribution determination of...

Analog signal test using a-priori information

Re-configurable architecture for automated test equipment

Method and system for per-pin clock synthesis of an electronic devi...

Parameterized signal conditioning

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR DEVICE TESTING TO AVOID RESOURCE CONFLICTS...

TEST APPARATUS FOR PERFORMING A TEST ON A DEVICE UNDER TEST AND DAT...

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST USING RELEVANCE S...

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...

TEST APPARATUS AND METHOD FOR CHARACTERIZING A DEVICE UNDER TEST

AUTOMATED TEST EQUIPMENT FOR COMBINED SIGNALS

TEST APPARATUS AND METHOD FOR TESTING A DEVICE UNDER TEST

BIT SEQUENCE GENERATOR AND APPARATUS FOR CALCULATING A SUB-RATE TRA...

Device Under Test Data Processing Techniques

Techniques for Determining a Fault Probability of a Location on a Chip

Reconfigurable Automatic Test Circuit Techniques

APPARATUS FOR DETERMINING A NUMBER OF SUCCESSIVE EQUAL BITS PRECEDI...

APPARATUS COMPRISING A RECURSIVE DELAYER AND METHOD FOR MEASURING A...

APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMI...

RE-CONFIGURABLE TEST CIRCUIT, METHOD FOR OPERATING AN AUTOMATED TES...

DECORRELATION OF DATA BY USING THIS DATA

STATE MACHINE AND GENERATOR FOR GENERATING A DESCRIPTION OF A STATE...

DATA PROCESSING UNIT AND A METHOD OF PROCESSING DATA

APPARATUS AND METHOD FOR ESTIMATING DATA RELATING TO A TIME DIFFERE...

METHOD OF SHARING A TEST RESOURCE AT A PLURALITY OF TEST SITES, AUT...

METHOD AND APPARATUS FOR DETERMINING RELEVANCE VALUES FOR A DETECTI...

ASYNCHRONOUS SIGMA-DELTA DIGITAL-ANALOG CONVERTER

FORMAT TRANSFORMATION OF TEST DATA

TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF...

CALIBRATING SIGNALS BY TIME ADJUSTMENT

Analog signal test using a-priori information

Parameterized Signal Conditioning

Re-configurable architecture for automated test equipment

Evaluation of an output signal of a device under test

Jitter generation