Jochen Rivoir

Person

Maqstadt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for device testing to avoid resource conflicts...
- Patent number 12,124,359
- Issue date Oct 22, 2024
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tester and method for testing a device under test using relevance s...
- Patent number 11,200,156
- Issue date Dec 14, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for combined signals
- Patent number 11,187,743
- Issue date Nov 30, 2021
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for performing a test on a device under test and dat...
- Patent number 11,182,274
- Issue date Nov 23, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and method for characterizing a device under test
- Patent number 11,036,623
- Issue date Jun 15, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and method for testing a device under test
- Patent number 10,775,437
- Issue date Sep 15, 2020
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for wireless testing of a plurality of transmi...
- Patent number 9,847,843
- Issue date Dec 19, 2017
- Advantest Corporation
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Techniques for determining a fault probability of a location on a chip
- Patent number 9,658,282
- Issue date May 23, 2017
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Bit sequence generator and apparatus for calculating a sub-rate tra...
- Patent number 9,575,726
- Issue date Feb 21, 2017
- Advantest Corporation
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device under test data processing techniques
- Patent number 9,341,673
- Issue date May 17, 2016
- Advantest Corporation
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for determining a number of successive equal bits precedi...
- Patent number 9,164,726
- Issue date Oct 20, 2015
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus comprising a recursive delayer and method for measuring a...
- Patent number 9,140,750
- Issue date Sep 22, 2015
- Advantest Corporation
- Marco Pausini
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adjusting transitions in a bit stream
- Patent number 9,103,887
- Issue date Aug 11, 2015
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Data processing unit and a method of processing data
- Patent number 8,886,987
- Issue date Nov 11, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
State machine and generator for generating a description of a state...
- Patent number 8,880,574
- Issue date Nov 4, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Re-configurable test circuit, method for operating an automated tes...
- Patent number 8,838,406
- Issue date Sep 16, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for estimating data relating to a time differe...
- Patent number 8,825,424
- Issue date Sep 2, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Grant
Method of sharing a test resource at a plurality of test sites, aut...
- Patent number 8,797,046
- Issue date Aug 5, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining relevance values for a detecti...
- Patent number 8,745,568
- Issue date Jun 3, 2014
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Format transformation of test data
- Patent number 8,418,010
- Issue date Apr 9, 2013
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G11 - INFORMATION STORAGE
Information Patent Grant
Evaluation of an output signal of a device under test
- Patent number 8,378,707
- Issue date Feb 19, 2013
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Decorrelation of data by using this data
- Patent number 8,253,605
- Issue date Aug 28, 2012
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Calibrating signals by time adjustment
- Patent number 8,169,212
- Issue date May 1, 2012
- Advantest (Singapore) Pte Ltd
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Asynchronous sigma-delta digital-analog converter
- Patent number 7,847,716
- Issue date Dec 7, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Time-to-digital conversion with calibration pulse injection
- Patent number 7,791,525
- Issue date Sep 7, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Grant
Time-to-digital conversion with delay contribution determination of...
- Patent number 7,782,242
- Issue date Aug 24, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Grant
Analog signal test using a-priori information
- Patent number 7,672,804
- Issue date Mar 2, 2010
- Agilent Technologies, Inc.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Grant
Re-configurable architecture for automated test equipment
- Patent number 7,590,903
- Issue date Sep 15, 2009
- Verigy (Singapore) Pte. Ltd.
- Erik Volkerink
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for per-pin clock synthesis of an electronic devi...
- Patent number 7,512,858
- Issue date Mar 31, 2009
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETERMINING AND INFORMATION ABOUT CHARACTE...
- Publication number 20250004039
- Publication date Jan 2, 2025
- Advantest Corporation
- Jochen RIVOIR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DEVICE TESTING TO AVOID RESOURCE CONFLICTS...
- Publication number 20220253375
- Publication date Aug 11, 2022
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS FOR PERFORMING A TEST ON A DEVICE UNDER TEST AND DAT...
- Publication number 20200019491
- Publication date Jan 16, 2020
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST USING RELEVANCE S...
- Publication number 20190377670
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...
- Publication number 20190377027
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND METHOD FOR CHARACTERIZING A DEVICE UNDER TEST
- Publication number 20190370158
- Publication date Dec 5, 2019
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED TEST EQUIPMENT FOR COMBINED SIGNALS
- Publication number 20180088172
- Publication date Mar 29, 2018
- Advantest Corporation
- ANDREAS HANTSCH
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20160334466
- Publication date Nov 17, 2016
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
BIT SEQUENCE GENERATOR AND APPARATUS FOR CALCULATING A SUB-RATE TRA...
- Publication number 20150268933
- Publication date Sep 24, 2015
- Advantest Pte. Ltd.
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device Under Test Data Processing Techniques
- Publication number 20150039927
- Publication date Feb 5, 2015
- ADVANTEST (SINGAPORE) PTE LTD
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Determining a Fault Probability of a Location on a Chip
- Publication number 20140336958
- Publication date Nov 13, 2014
- ADVANTEST (SINGAPORE) PTE LTD
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Reconfigurable Automatic Test Circuit Techniques
- Publication number 20140336974
- Publication date Nov 13, 2014
- ADVANTEST (SINGAPORE) PTE LTD
- Rivoir Jochen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETERMINING A NUMBER OF SUCCESSIVE EQUAL BITS PRECEDI...
- Publication number 20130198252
- Publication date Aug 1, 2013
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS COMPRISING A RECURSIVE DELAYER AND METHOD FOR MEASURING A...
- Publication number 20120256639
- Publication date Oct 11, 2012
- Marco Pausini
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMI...
- Publication number 20120232826
- Publication date Sep 13, 2012
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RE-CONFIGURABLE TEST CIRCUIT, METHOD FOR OPERATING AN AUTOMATED TES...
- Publication number 20110276302
- Publication date Nov 10, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
DECORRELATION OF DATA BY USING THIS DATA
- Publication number 20110254719
- Publication date Oct 20, 2011
- VERIGY (SINGAPORE) PTE. LTD.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STATE MACHINE AND GENERATOR FOR GENERATING A DESCRIPTION OF A STATE...
- Publication number 20110231464
- Publication date Sep 22, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING UNIT AND A METHOD OF PROCESSING DATA
- Publication number 20110197086
- Publication date Aug 11, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS AND METHOD FOR ESTIMATING DATA RELATING TO A TIME DIFFERE...
- Publication number 20110140737
- Publication date Jun 16, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Application
METHOD OF SHARING A TEST RESOURCE AT A PLURALITY OF TEST SITES, AUT...
- Publication number 20110041012
- Publication date Feb 17, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING RELEVANCE VALUES FOR A DETECTI...
- Publication number 20110032829
- Publication date Feb 10, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
ASYNCHRONOUS SIGMA-DELTA DIGITAL-ANALOG CONVERTER
- Publication number 20100045499
- Publication date Feb 25, 2010
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FORMAT TRANSFORMATION OF TEST DATA
- Publication number 20100011252
- Publication date Jan 14, 2010
- Verigy ( Singapore) Pte. Ltd.
- Jochen Rivoir
- G11 - INFORMATION STORAGE
Information Patent Application
TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF...
- Publication number 20090322574
- Publication date Dec 31, 2009
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G04 - HOROLOGY
Information Patent Application
CALIBRATING SIGNALS BY TIME ADJUSTMENT
- Publication number 20090219010
- Publication date Sep 3, 2009
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Analog signal test using a-priori information
- Publication number 20090063100
- Publication date Mar 5, 2009
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Parameterized Signal Conditioning
- Publication number 20080208510
- Publication date Aug 28, 2008
- Marc Moessinger
- G01 - MEASURING TESTING
Information Patent Application
Re-configurable architecture for automated test equipment
- Publication number 20070266288
- Publication date Nov 15, 2007
- Erik Volkerink
- G01 - MEASURING TESTING
Information Patent Application
Evaluation of an output signal of a device under test
- Publication number 20070150224
- Publication date Jun 28, 2007
- AGILENT TECHNOLOGIES, INC.
- Jochen Rivoir
- G01 - MEASURING TESTING

Jochen Rivoir

Person

Patents Grantslast 30 patents

Systems and methods for device testing to avoid resource conflicts...

Tester and method for testing a device under test using relevance s...

Automated test equipment for combined signals

Test apparatus for performing a test on a device under test and dat...

Tester and method for testing a device under test and tester and me...

Test apparatus and method for characterizing a device under test

Test apparatus and method for testing a device under test

Apparatus and method for wireless testing of a plurality of transmi...

Techniques for determining a fault probability of a location on a chip

Bit sequence generator and apparatus for calculating a sub-rate tra...

Device under test data processing techniques

Apparatus for determining a number of successive equal bits precedi...

Apparatus comprising a recursive delayer and method for measuring a...

Method and apparatus for adjusting transitions in a bit stream

Data processing unit and a method of processing data

State machine and generator for generating a description of a state...

Re-configurable test circuit, method for operating an automated tes...

Apparatus and method for estimating data relating to a time differe...

Method of sharing a test resource at a plurality of test sites, aut...

Method and apparatus for determining relevance values for a detecti...

Format transformation of test data

Evaluation of an output signal of a device under test

Decorrelation of data by using this data

Calibrating signals by time adjustment

Asynchronous sigma-delta digital-analog converter

Time-to-digital conversion with calibration pulse injection

Time-to-digital conversion with delay contribution determination of...

Analog signal test using a-priori information

Re-configurable architecture for automated test equipment

Method and system for per-pin clock synthesis of an electronic devi...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR DETERMINING AND INFORMATION ABOUT CHARACTE...

SYSTEMS AND METHODS FOR DEVICE TESTING TO AVOID RESOURCE CONFLICTS...

TEST APPARATUS FOR PERFORMING A TEST ON A DEVICE UNDER TEST AND DAT...

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST USING RELEVANCE S...

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...

TEST APPARATUS AND METHOD FOR CHARACTERIZING A DEVICE UNDER TEST

AUTOMATED TEST EQUIPMENT FOR COMBINED SIGNALS

TEST APPARATUS AND METHOD FOR TESTING A DEVICE UNDER TEST

BIT SEQUENCE GENERATOR AND APPARATUS FOR CALCULATING A SUB-RATE TRA...

Device Under Test Data Processing Techniques

Techniques for Determining a Fault Probability of a Location on a Chip

Reconfigurable Automatic Test Circuit Techniques

APPARATUS FOR DETERMINING A NUMBER OF SUCCESSIVE EQUAL BITS PRECEDI...

APPARATUS COMPRISING A RECURSIVE DELAYER AND METHOD FOR MEASURING A...

APPARATUS AND METHOD FOR WIRELESS TESTING OF A PLURALITY OF TRANSMI...

RE-CONFIGURABLE TEST CIRCUIT, METHOD FOR OPERATING AN AUTOMATED TES...

DECORRELATION OF DATA BY USING THIS DATA

STATE MACHINE AND GENERATOR FOR GENERATING A DESCRIPTION OF A STATE...

DATA PROCESSING UNIT AND A METHOD OF PROCESSING DATA

APPARATUS AND METHOD FOR ESTIMATING DATA RELATING TO A TIME DIFFERE...

METHOD OF SHARING A TEST RESOURCE AT A PLURALITY OF TEST SITES, AUT...

METHOD AND APPARATUS FOR DETERMINING RELEVANCE VALUES FOR A DETECTI...

ASYNCHRONOUS SIGMA-DELTA DIGITAL-ANALOG CONVERTER

FORMAT TRANSFORMATION OF TEST DATA

TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF...

CALIBRATING SIGNALS BY TIME ADJUSTMENT

Analog signal test using a-priori information

Parameterized Signal Conditioning

Re-configurable architecture for automated test equipment

Evaluation of an output signal of a device under test