Jochen Schlereth

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Sondheim/Rhon, DE

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Patents Grantslast 30 patents

Information Patent Grant
Arrangement for spatially resolving projected-capacitive touch dete...
- Patent number 11,354,003
- Issue date Jun 7, 2022
- Preh GmbH
- Rainer Schlegelmilch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Input device with function triggering or control which takes place...
- Patent number 10,924,111
- Issue date Feb 16, 2021
- PREH GMBH
- Norbert Bauer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Input device with a two-part force sensor for actuation inputs and...
- Patent number 10,236,881
- Issue date Mar 19, 2019
- Preh GmbH
- Juergen Nauth
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Capacitive control element with improved malfunction immunity
- Patent number 10,177,762
- Issue date Jan 8, 2019
- Preh GmbH
- Alain Dani
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ARRANGEMENT FOR SPATIALLY RESOLVING PROJECTED-CAPACITIVE TOUCH DETE...
- Publication number 20210149526
- Publication date May 20, 2021
- Preh GmbH
- Rainer SCHLEGELMILCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INPUT DEVICE WITH FUNCTION TRIGGERING OR CONTROL WHICH TAKES PLACE...
- Publication number 20200052695
- Publication date Feb 13, 2020
- Preh GmbH
- Norbert BAUER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ARRANGEMENT FOR SPATIALLY RESOLVING PROJECTED-CAPACITIVE TOUCH DETE...
- Publication number 20180088704
- Publication date Mar 29, 2018
- Preh GmbH
- Rainer SCHLEGELMILCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INPUT DEVICE WITH A TWO-PART FORCE SENSOR FOR ACTUATION INPUTS AND...
- Publication number 20170353182
- Publication date Dec 7, 2017
- Preh GmbH
- JUERGEN NAUTH
- G01 - MEASURING TESTING
Information Patent Application
Capacitive control element with improved malfunction immunity
- Publication number 20170052073
- Publication date Feb 23, 2017
- Preh GmbH
- Alain Dani
- G01 - MEASURING TESTING