Jochen Sieber

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Mannheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for investigating a sample with regard to the...
- Patent number 9,274,057
- Issue date Mar 1, 2016
- Leica Microsystems CMS GmbH
- Juergen Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for providing a predeterminable concentration of...
- Patent number 8,373,853
- Issue date Feb 12, 2013
- Leica Microsystems CMS GmbH
- Jochen Sieber
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for high spatial resolution stochastic examination of a samp...
- Patent number 8,293,490
- Issue date Oct 23, 2012
- Leica Microsystems CMS GmbH
- Volker Seyfried
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Investigating a Sample with Regard to the...
- Publication number 20150123013
- Publication date May 7, 2015
- Leica Microsystems CMS GmbH
- Juergen Schneider
- G02 - OPTICS
Information Patent Application
METHOD FOR HIGH SPATIAL RESOLUTION STOCHASTIC EXAMINATION OF A SAMP...
- Publication number 20100160613
- Publication date Jun 24, 2010
- Leica Microsystems CMS GmbH
- Volker Seyfried
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR HIGH SPATIAL RESOLUTION EXAMINATION OF A SAMPLE STRUCTU...
- Publication number 20100124788
- Publication date May 20, 2010
- Leica Microsystems CMS GmbH
- Jochen Sieber
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR PROVIDING A PREDETERMINABLE CONCENTRATION OF...
- Publication number 20100122588
- Publication date May 20, 2010
- Leica Microsystems CMS GmbH
- Jochen Sieber
- G05 - CONTROLLING REGULATING