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Joe Hodkiewicz
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Madison, WI, US
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last 30 patents
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Patent Grant
Beam alignment in spectroscopic microscopes
Patent number
7,460,229
Issue date
Dec 2, 2008
Thermo Electron Scientific Instruments LLC
Francis J. Deck
G01 - MEASURING TESTING
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Patent Grant
Devices and methods for multi-mode analytical microscopy, in partic...
Patent number
7,391,509
Issue date
Jun 24, 2008
Thermo Electron Scientific Instruments LLC
Francis J. Deck
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Beam alignment in spectroscopic microscopes
Publication number
20070165221
Publication date
Jul 19, 2007
Francis J. Deck
G02 - OPTICS