Joe Wang

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for bare wafer inspection
- Patent number 11,791,127
- Issue date Oct 17, 2023
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-cell detector for charged particles
- Patent number 11,784,024
- Issue date Oct 10, 2023
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection of buried features by backscattered particles
- Patent number 11,443,915
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-cell detector for charged particles
- Patent number 11,222,766
- Issue date Jan 11, 2022
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for bare wafer inspection
- Patent number 11,087,954
- Issue date Aug 10, 2021
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for enhancing image quality
- Patent number 9,436,985
- Issue date Sep 6, 2016
- Hermes Microvision Inc.
- Chiyan Kuan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic focus adjustment with optical height detection apparatus in...
- Patent number 9,400,176
- Issue date Jul 26, 2016
- Hermes-Microvision, Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Grant
Energy filter for charged particle beam apparatus
- Patent number 9,384,936
- Issue date Jul 5, 2016
- Hermes Microvision Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection system
- Patent number 9,076,629
- Issue date Jul 7, 2015
- Hermes Microvision Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for enhancing image quality
- Patent number 9,002,097
- Issue date Apr 7, 2015
- Hermes Microvision Inc.
- Chiyan Kuan
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic focus adjustment with optical height detection apparatus in...
- Patent number 8,791,414
- Issue date Jul 29, 2014
- Hermes Microvision, Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Grant
Movable detector for charged particle beam inspection or review
- Patent number 8,624,186
- Issue date Jan 7, 2014
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection system
- Patent number 8,552,377
- Issue date Oct 8, 2013
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam detection unit with multi type detection subu...
- Patent number 8,350,213
- Issue date Jan 8, 2013
- Hermes Microvision Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection system
- Patent number 8,237,125
- Issue date Aug 7, 2012
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for a charged particle beam
- Patent number 8,164,060
- Issue date Apr 24, 2012
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
E-beam defect review system
- Patent number 8,094,924
- Issue date Jan 10, 2012
- Hermes-Microvision, Inc.
- Jack Jau
- G01 - MEASURING TESTING
Information Patent Grant
Method for regulating scanning sample surface charge in continuous...
- Patent number 7,973,283
- Issue date Jul 5, 2011
- Hermes-Microvision, Inc.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 7,960,697
- Issue date Jun 14, 2011
- Hermes-Microvision, Inc.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system including segmented detection elements
- Patent number 7,928,383
- Issue date Apr 19, 2011
- Hermes-Microvision, Inc.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operation stage for wafer edge inspection and review
- Patent number 7,919,760
- Issue date Apr 5, 2011
- Hermes-Microvision, Inc.
- Jack Jau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection devices
- Patent number 7,872,236
- Issue date Jan 18, 2011
- Hermes Microvision, Inc.
- Xu Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for a charged particle beam
- Patent number 7,825,386
- Issue date Nov 2, 2010
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, defect review tools, and systems for locating a defect in...
- Patent number 7,747,062
- Issue date Jun 29, 2010
- KLA-Tencor Technologies Corp.
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-CELL DETECTOR FOR CHARGED PARTICLES
- Publication number 20220246391
- Publication date Aug 4, 2022
- ASML NETHERLANDS B.V.
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR BARE WAFER INSPECTION
- Publication number 20220068592
- Publication date Mar 3, 2022
- ASML NETHERLANDS B.V.
- Wei FANG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CELL DETECTOR FOR CHARGED PARTICLES
- Publication number 20200286708
- Publication date Sep 10, 2020
- ASML NETHERLANDS B.V.
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION OF BURIED FEATURES BY BACKSCATTERED PARTICLES
- Publication number 20200243299
- Publication date Jul 30, 2020
- ASML NETHERLANDS B.V.
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR BARE WAFER INSPECTION
- Publication number 20200027693
- Publication date Jan 23, 2020
- ASML Netherlands B.V.
- Wei FANG
- G01 - MEASURING TESTING
Information Patent Application
Energy Filter for Charged Particle Beam Apparatus
- Publication number 20160035533
- Publication date Feb 4, 2016
- HERMES MICROVISION INC.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic Focus Adjustment with Optical Height Detection Apparatus in...
- Publication number 20140291517
- Publication date Oct 2, 2014
- JOE WANG
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20130327953
- Publication date Dec 12, 2013
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20120145898
- Publication date Jun 14, 2012
- HERMES MICROVISION, INC.
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Movable Detector for Charged Particle Beam Inspection or Review
- Publication number 20110291007
- Publication date Dec 1, 2011
- Hermes Microvision, Inc.
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic Focus Adjustment with Optical Height Detection Apparatus in...
- Publication number 20110260055
- Publication date Oct 27, 2011
- Hermes Microvision, Inc.
- JOE WANG
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20110260069
- Publication date Oct 27, 2011
- Hermes Microvision, Inc.
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Detection Unit with Multi Type Detection Subu...
- Publication number 20110215241
- Publication date Sep 8, 2011
- Hermes Microvision, Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM
- Publication number 20100270468
- Publication date Oct 28, 2010
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
E-BEAM DEFECT REVIEW SYSTEM
- Publication number 20100150429
- Publication date Jun 17, 2010
- Hermes-Microvision, Inc.
- Jack JAU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATION STAGE FOR WAFER EDGE INSPECTION AND REVIEW
- Publication number 20100140498
- Publication date Jun 10, 2010
- HERMES-MICROVISION, INC.
- JACK JAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20100102227
- Publication date Apr 29, 2010
- HERMES-MICROVISION, INC
- ZHONGWEI CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for regulating scanning sample surface charge in continuous...
- Publication number 20100072364
- Publication date Mar 25, 2010
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION DEVICES
- Publication number 20090090866
- Publication date Apr 9, 2009
- HERMES MICROVISION, INC., TAIWAN
- Xu ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION DEVICES
- Publication number 20080315094
- Publication date Dec 25, 2008
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS OF WAFER SURFACE POTENTIAL REGULATION
- Publication number 20080296496
- Publication date Dec 4, 2008
- Hermes Microvision, Inc. (TAIWAN)
- Yan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM
- Publication number 20080121810
- Publication date May 29, 2008
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods, defect review tools, and systems for locating a defect in...
- Publication number 20080032429
- Publication date Feb 7, 2008
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

System and method for bare wafer inspection

Multi-cell detector for charged particles

Detection of buried features by backscattered particles

Multi-cell detector for charged particles

System and method for bare wafer inspection

Method and system for enhancing image quality

Dynamic focus adjustment with optical height detection apparatus in...

Energy filter for charged particle beam apparatus

Particle detection system

Method and system for enhancing image quality

Dynamic focus adjustment with optical height detection apparatus in...

Movable detector for charged particle beam inspection or review

Particle detection system

Charged particle beam detection unit with multi type detection subu...

Particle detection system

System and method for a charged particle beam

E-beam defect review system

Method for regulating scanning sample surface charge in continuous...

Electron beam apparatus

Charged particle system including segmented detection elements

Operation stage for wafer edge inspection and review

Charged particle detection devices

System and method for a charged particle beam

Methods, defect review tools, and systems for locating a defect in...

Patents Applicationslast 30 patents

MULTI-CELL DETECTOR FOR CHARGED PARTICLES

SYSTEM AND METHOD FOR BARE WAFER INSPECTION

MULTI-CELL DETECTOR FOR CHARGED PARTICLES

DETECTION OF BURIED FEATURES BY BACKSCATTERED PARTICLES

SYSTEM AND METHOD FOR BARE WAFER INSPECTION

Energy Filter for Charged Particle Beam Apparatus

Dynamic Focus Adjustment with Optical Height Detection Apparatus in...

PARTICLE DETECTION SYSTEM

PARTICLE DETECTION SYSTEM

Movable Detector for Charged Particle Beam Inspection or Review

Dynamic Focus Adjustment with Optical Height Detection Apparatus in...

PARTICLE DETECTION SYSTEM

Charged Particle Beam Detection Unit with Multi Type Detection Subu...

SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM

E-BEAM DEFECT REVIEW SYSTEM

OPERATION STAGE FOR WAFER EDGE INSPECTION AND REVIEW

ELECTRON BEAM APPARATUS

Method for regulating scanning sample surface charge in continuous...

CHARGED PARTICLE DETECTION DEVICES

CHARGED PARTICLE DETECTION DEVICES

METHOD AND APPARATUS OF WAFER SURFACE POTENTIAL REGULATION

SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM

Methods, defect review tools, and systems for locating a defect in...