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Joel B. LeBret
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Meridian, ID, US
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Patents Grants
last 30 patents
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Patent Grant
Methods for acquiring planar view STEM images of device structures
Patent number
10,539,489
Issue date
Jan 21, 2020
Micron Technology, Inc.
Jamie C. Porter
G01 - MEASURING TESTING
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Patent Grant
Methods for acquiring planar view stem images of device structures
Patent number
10,410,829
Issue date
Sep 10, 2019
Micron Technology, Inc.
Jamie C. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for acquiring planar view stem images of device structures
Patent number
10,401,265
Issue date
Sep 3, 2019
Micron Technology, Inc.
Jamie C. Porter
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
METHODS FOR ACQUIRING PLANAR VIEW STEM IMAGES OF DEVICE STRUCTURES
Publication number
20190353566
Publication date
Nov 21, 2019
Micron Technology, Inc.
Jamie C. Porter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR ACQUIRING PLANAR VIEW STEM IMAGES OF DEVICE STRUCTURES
Publication number
20190304744
Publication date
Oct 3, 2019
Jamie C. Porter
H01 - BASIC ELECTRIC ELEMENTS