Joel Estrella

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Bath systems and methods thereof
- Patent number 11,738,363
- Issue date Aug 29, 2023
- Tokyo Electron Limited
- Michael Carcasi
- B08 - CLEANING
Information Patent Grant
Systems and methods for spin process video analysis during substrat...
- Patent number 11,637,031
- Issue date Apr 25, 2023
- Tokyo Electron Limited
- Michael Carcasi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhancement of yield of functional microelectronic devices
- Patent number 11,435,393
- Issue date Sep 6, 2022
- Tokyo Electron Limited
- Carlos A. Fonseca
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhancement of yield of functional microelectronic devices
- Patent number 11,346,882
- Issue date May 31, 2022
- Tokyo Electron Limited
- Carlos A. Fonseca
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for automated video analysis detection techniqu...
- Patent number 11,276,157
- Issue date Mar 15, 2022
- Tokyo Electron Limited
- Joel Estrella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Amelioration of global wafer distortion based on determination of l...
- Patent number 10,622,233
- Issue date Apr 14, 2020
- Tokyo Electron Limited
- Joshua Hooge
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Bath Systems and Methods Thereof
- Publication number 20230356255
- Publication date Nov 9, 2023
- TOKYO ELECTRON LIMITED
- Michael Carcasi
- B08 - CLEANING
Information Patent Application
WAFER BATH IMAGING
- Publication number 20220405902
- Publication date Dec 22, 2022
- TOKYO ELECTRON LIMITED
- Joel Estrella
- B08 - CLEANING
Information Patent Application
Bath Systems and Methods Thereof
- Publication number 20220388022
- Publication date Dec 8, 2022
- TOKYO ELECTRON LIMITED
- Michael Carcasi
- B08 - CLEANING
Information Patent Application
Systems and Methods for Automated Video Analysis Detection Techniqu...
- Publication number 20210150697
- Publication date May 20, 2021
- TOKYO ELECTRON LIMITED
- Joel Estrella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Spin Process Video Analysis During Substrat...
- Publication number 20210129166
- Publication date May 6, 2021
- TOKYO ELECTRON LIMITED
- Michael Carcasi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Spin Process Video Analysis During Substrat...
- Publication number 20210134637
- Publication date May 6, 2021
- TOKYO ELECTRON LIMITED
- Michael Carcasi
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
ENHANCEMENT OF YIELD OF FUNCTIONAL MICROELECTRONIC DEVICES
- Publication number 20190137565
- Publication date May 9, 2019
- TOKYO ELECTRON LIMITED
- Carlos A. Fonseca
- G01 - MEASURING TESTING
Information Patent Application
ENHANCEMENT OF YIELD OF FUNCTIONAL MICROELECTRONIC DEVICES
- Publication number 20190139798
- Publication date May 9, 2019
- TOKYO ELECTRON LIMITED
- Carlos A. Fonseca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AMELIORATION OF GLOBAL WAFER DISTORTION BASED ON DETERMINATION OF L...
- Publication number 20180342410
- Publication date Nov 29, 2018
- TOKYO ELECTRON LIMITED
- Joshua Hooge
- G06 - COMPUTING CALCULATING COUNTING

Joel Estrella

Person

Patents Grantslast 30 patents

Bath systems and methods thereof

Systems and methods for spin process video analysis during substrat...

Enhancement of yield of functional microelectronic devices

Enhancement of yield of functional microelectronic devices

Systems and methods for automated video analysis detection techniqu...

Amelioration of global wafer distortion based on determination of l...

Patents Applicationslast 30 patents

Bath Systems and Methods Thereof

WAFER BATH IMAGING

Bath Systems and Methods Thereof

Systems and Methods for Automated Video Analysis Detection Techniqu...

Systems and Methods for Spin Process Video Analysis During Substrat...

Systems and Methods for Spin Process Video Analysis During Substrat...

ENHANCEMENT OF YIELD OF FUNCTIONAL MICROELECTRONIC DEVICES

ENHANCEMENT OF YIELD OF FUNCTIONAL MICROELECTRONIC DEVICES

AMELIORATION OF GLOBAL WAFER DISTORTION BASED ON DETERMINATION OF L...