Joel N. Erdman

Person

Waconia, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit contact test apparatus with and method of constr...
- Patent number 11,467,183
- Issue date Oct 11, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contact test apparatus with and method of constr...
- Patent number 10,794,933
- Issue date Oct 6, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
- Patent number 10,247,755
- Issue date Apr 2, 2019
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
- Patent number 9,500,673
- Issue date Nov 22, 2016
- Johnstech International Corporation
- Joel Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive Kelvin contacts for microcircuit tester
- Patent number 9,329,204
- Issue date May 3, 2016
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive kelvin contacts for microcircuit tester
- Patent number 8,988,090
- Issue date Mar 24, 2015
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Compliant contact plate for use in testing integrated circuits
- Patent number 8,690,597
- Issue date Apr 8, 2014
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive Kelvin contacts for microcircuit tester
- Patent number 8,558,554
- Issue date Oct 15, 2013
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTR...
- Publication number 20210018533
- Publication date Jan 21, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20190302145
- Publication date Oct 3, 2019
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20160320429
- Publication date Nov 3, 2016
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20140103949
- Publication date Apr 17, 2014
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20130099810
- Publication date Apr 25, 2013
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Compliant Contact Plate For Use In Testing Integrated Circuits
- Publication number 20120282799
- Publication date Nov 8, 2012
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20120092034
- Publication date Apr 19, 2012
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20100264935
- Publication date Oct 21, 2010
- Joel N. Erdman
- G01 - MEASURING TESTING

Joel N. Erdman

Person

Patents Grantslast 30 patents

Integrated circuit contact test apparatus with and method of constr...

Integrated circuit contact test apparatus with and method of constr...

Electrically conductive kelvin contacts for microcircuit tester

Electrically conductive kelvin contacts for microcircuit tester

Electrically conductive Kelvin contacts for microcircuit tester

Electrically conductive kelvin contacts for microcircuit tester

Compliant contact plate for use in testing integrated circuits

Electrically conductive Kelvin contacts for microcircuit tester

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTR...

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Compliant Contact Plate For Use In Testing Integrated Circuits

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Kelvin Contacts For Microcircuit Tester