JOEL R. KNIGHT

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AUSTIN, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for digital only secure test mode entry
- Patent number 11,144,677
- Issue date Oct 12, 2021
- NXP USA, INC.
- Stefan Doll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secure low voltage testing
- Patent number 9,891,277
- Issue date Feb 13, 2018
- NXP USA, INC.
- Joel R. Knight
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Digital Only Secure Test Mode Entry
- Publication number 20210042447
- Publication date Feb 11, 2021
- NXP USA, Inc.
- Stefan Doll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURE LOW VOLTAGE TESTING
- Publication number 20160091561
- Publication date Mar 31, 2016
- FREESCALE SEMICONDUCTOR, INC.
- JOEL R. KNIGHT
- G01 - MEASURING TESTING