Joel R. Stanford

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Surface probe for determining physical properties of a semiconducto...
- Patent number 6,211,685
- Issue date Apr 3, 2001
- Advanced Micro Devices, Inc.
- Joel R. Stanford
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for measuring the roughness of a target materi...
- Patent number 6,005,915
- Issue date Dec 21, 1999
- Advanced Micro Devices, Inc.
- Tim Z. Hossain
- G01 - MEASURING TESTING