Joemar Sinipete

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Refresh operation of a memory cell
- Patent number 11,798,622
- Issue date Oct 24, 2023
- Micron Technology, Inc.
- Joemar Sinipete
- G11 - INFORMATION STORAGE
Information Patent Grant
Refresh operation of a memory cell
- Patent number 11,404,120
- Issue date Aug 2, 2022
- Micron Technology, Inc.
- Joemar Sinipete
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory devices configured to perform leak checks
- Patent number 10,665,307
- Issue date May 26, 2020
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory devices configured to perform leak checks
- Patent number 10,366,767
- Issue date Jul 30, 2019
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Grant
Program operations with embedded leak checks
- Patent number 9,761,322
- Issue date Sep 12, 2017
- Micron Technology, Inc.
- Jeffery A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Program operations with embedded leak checks
- Patent number 9,281,078
- Issue date Mar 8, 2016
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory block testing
- Patent number 8,094,508
- Issue date Jan 10, 2012
- Micron Technology, Inc.
- Scott N. Gatzemeier
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory block testing
- Patent number 7,567,472
- Issue date Jul 28, 2009
- Micron Technology, Inc.
- Scott N. Gatzemeier
- G11 - INFORMATION STORAGE
Information Patent Grant
Die based trimming
- Patent number 7,512,507
- Issue date Mar 31, 2009
- Micron Technology, Inc.
- Scott N. Gatzemeier
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF-TEST CIRCUITRY
- Publication number 20240087663
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE
Information Patent Application
REFRESH OPERATION OF A MEMORY CELL
- Publication number 20220415395
- Publication date Dec 29, 2022
- Micron Technology, Inc.
- Joemar Sinipete
- G11 - INFORMATION STORAGE
Information Patent Application
REFRESH OPERATION OF A MEMORY CELL
- Publication number 20210358546
- Publication date Nov 18, 2021
- Micron Technology, Inc.
- Joemar Sinipete
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS
- Publication number 20190287634
- Publication date Sep 19, 2019
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS
- Publication number 20170352431
- Publication date Dec 7, 2017
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Application
PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS
- Publication number 20160155513
- Publication date Jun 2, 2016
- Micron Technology, Inc.
- Jeffery A. Kessenich
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS
- Publication number 20150364213
- Publication date Dec 17, 2015
- Micron Technology, Inc.
- Jeffrey A. Kessenich
- G01 - MEASURING TESTING
Information Patent Application
MEMORY BLOCK TESTING
- Publication number 20090290441
- Publication date Nov 26, 2009
- Micron Technology, Inc.
- Scott N. Gatzemeier
- G11 - INFORMATION STORAGE
Information Patent Application
Memory block testing
- Publication number 20070266276
- Publication date Nov 15, 2007
- Micron Technology, Inc.
- Scott N. Gatzemeier
- G11 - INFORMATION STORAGE
Information Patent Application
DIE BASED TRIMMING
- Publication number 20070225928
- Publication date Sep 27, 2007
- Micron Technology, Inc.
- Scott N. Gatzemeier
- G11 - INFORMATION STORAGE

Joemar Sinipete

Person

Patents Grantslast 30 patents

Refresh operation of a memory cell

Refresh operation of a memory cell

Memory devices configured to perform leak checks

Memory devices configured to perform leak checks

Program operations with embedded leak checks

Program operations with embedded leak checks

Memory block testing

Memory block testing

Die based trimming

Patents Applicationslast 30 patents

BUILT-IN SELF-TEST CIRCUITRY

REFRESH OPERATION OF A MEMORY CELL

REFRESH OPERATION OF A MEMORY CELL

MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS

MEMORY DEVICES CONFIGURED TO PERFORM LEAK CHECKS

PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS

PROGRAM OPERATIONS WITH EMBEDDED LEAK CHECKS

MEMORY BLOCK TESTING

Memory block testing

DIE BASED TRIMMING