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Joerg BAEUERLE

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  • Baiersbronn, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Radiometric measurement device
    • Patent number 11,686,607
    • Issue date Jun 27, 2023
    • Berthold Technologies GmbH & Co. KG
    • Steffen Mueller
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring device for process metrology
    • Patent number 11,169,133
    • Issue date Nov 9, 2021
    • Berthold Technologies GmbH & Co. KG
    • Joerg Baeuerle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Microwave-based measuring device
    • Patent number 11,041,817
    • Issue date Jun 22, 2021
    • Berthold Technologies GmbH & Co. KG
    • Joerg Baeuerle
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Measurement Device for Process Metrology
    • Publication number 20250060406
    • Publication date Feb 20, 2025
    • Berthold Technologies GmbH & Co. KG
    • Steffen MUELLER
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measuring Device For Process Metrology
    • Publication number 20210041413
    • Publication date Feb 11, 2021
    • Berthold Technologies GmbH & Co. KG
    • Joerg BAEUERLE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Microwave-Based Measuring Device
    • Publication number 20210010952
    • Publication date Jan 14, 2021
    • Berthold Technologies GmbH & Co. KG
    • Joerg BAEUERLE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Radiometric Measurement Device
    • Publication number 20200249069
    • Publication date Aug 6, 2020
    • Berthold Technologies GmbH & Co. KG
    • Steffen MUELLER
    • G01 - MEASURING TESTING