Joerg Dietrich Schmid

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,102,174
- Issue date Jan 24, 2012
- Infineon Technologies North America Corp.
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,027,185
- Issue date Sep 27, 2011
- International Business Machines Corporation
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,004,278
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wafer for electrically characterizing tunnel junction film stacks w...
- Patent number 7,622,735
- Issue date Nov 24, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 6,927,569
- Issue date Aug 9, 2005
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic memory
- Patent number 6,768,150
- Issue date Jul 27, 2004
- Infineon Technologies Aktiengesellschaft
- Kia Seng Low
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20100023287
- Publication date Jan 28, 2010
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20090309587
- Publication date Dec 17, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20090267597
- Publication date Oct 29, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
WAFER FOR ELECTRICALLY CHARACTERIZING TUNNEL JUNCTION FILM STACKS W...
- Publication number 20090261820
- Publication date Oct 22, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Techniques for electrically characterizing tunnel junction film sta...
- Publication number 20040051522
- Publication date Mar 18, 2004
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING