Joerg Drescher

Person

Samerberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for correcting errors in position-measuring devices
- Patent number 10,060,772
- Issue date Aug 28, 2018
- Dr. Johannes Heidenhain GmbH
- Joerg Drescher
- G01 - MEASURING TESTING
Information Patent Grant
X-Y table with a position-measuring device
- Patent number 9,921,468
- Issue date Mar 20, 2018
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferential position-measuring device and method for operating a...
- Patent number 9,664,502
- Issue date May 30, 2017
- Dr. Johannes Heidenhain GmbH
- Markus Meissner
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device and system having such a position-measuri...
- Patent number 9,389,065
- Issue date Jul 12, 2016
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring instrument
- Patent number 9,389,100
- Issue date Jul 12, 2016
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device and system having a plurality of position...
- Patent number 9,200,893
- Issue date Dec 1, 2015
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 9,188,424
- Issue date Nov 17, 2015
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
System and method for positioning a processing tool in relation to...
- Patent number 9,151,593
- Issue date Oct 6, 2015
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device
- Patent number 8,988,691
- Issue date Mar 24, 2015
- Dr. Johannes Heidenhain GmbH
- Ralf Bihr
- G01 - MEASURING TESTING
Information Patent Grant
System having a plurality of scanning units of a position measuring...
- Patent number 8,842,295
- Issue date Sep 23, 2014
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Method for attaching a scale to a carrier, a scale, and carrier hav...
- Patent number 7,707,739
- Issue date May 4, 2010
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system
- Patent number 7,542,863
- Issue date Jun 2, 2009
- Dr. Johannes Heidenhain GmbH
- Joerg Drescher
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device and method for operating a position-measu...
- Patent number 7,389,595
- Issue date Jun 24, 2008
- Dr. Johannes Heidenhain GmbH
- Markus Meissner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Y TABLE WITH A POSITION-MEASURING DEVICE
- Publication number 20170102227
- Publication date Apr 13, 2017
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING ERRORS IN POSITION-MEASURING DEVICES
- Publication number 20160084685
- Publication date Mar 24, 2016
- Dr. Johannes Heidenhain Gmbh
- Joerg Drescher
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENTIAL POSITION-MEASURING DEVICE AND METHOD FOR OPERATING A...
- Publication number 20150354937
- Publication date Dec 10, 2015
- Dr. Johannes Heidenhain Gmbh
- Markus MEISSNER
- G01 - MEASURING TESTING
Information Patent Application
Interferometer
- Publication number 20140176962
- Publication date Jun 26, 2014
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POSITION MEASURING INSTRUMENT
- Publication number 20140132964
- Publication date May 15, 2014
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Position-Measuring Device
- Publication number 20130335750
- Publication date Dec 19, 2013
- Ralf Bihr
- G01 - MEASURING TESTING
Information Patent Application
Position-Measuring Device and System Having Such a Position-Measuri...
- Publication number 20130235390
- Publication date Sep 12, 2013
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Positioning a Processing Tool in Relation to...
- Publication number 20130212854
- Publication date Aug 22, 2013
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
System Having a Plurality of Scanning Units of a Position Measuring...
- Publication number 20130208287
- Publication date Aug 15, 2013
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Position-Measuring Device and System Having a Plurality of Position...
- Publication number 20130194584
- Publication date Aug 1, 2013
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Position measuring system
- Publication number 20070180725
- Publication date Aug 9, 2007
- Joerg Drescher
- G01 - MEASURING TESTING
Information Patent Application
Method for attaching a scale to a carrier, a scale, and carrier hav...
- Publication number 20070137059
- Publication date Jun 21, 2007
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Position-measuring device and method for operating a position-measu...
- Publication number 20070107247
- Publication date May 17, 2007
- Markus Meissner
- G01 - MEASURING TESTING
Information Patent Application
Position measuring system
- Publication number 20060092428
- Publication date May 4, 2006
- Wolfgang Holzapfel
- G01 - MEASURING TESTING

Joerg Drescher

Person

Patents Grantslast 30 patents

Method for correcting errors in position-measuring devices

X-Y table with a position-measuring device

Interferential position-measuring device and method for operating a...

Position-measuring device and system having such a position-measuri...

Optical position measuring instrument

Position-measuring device and system having a plurality of position...

Interferometer

System and method for positioning a processing tool in relation to...

Position-measuring device

System having a plurality of scanning units of a position measuring...

Method for attaching a scale to a carrier, a scale, and carrier hav...

Position measuring system

Position-measuring device and method for operating a position-measu...

Patents Applicationslast 30 patents

X-Y TABLE WITH A POSITION-MEASURING DEVICE

METHOD FOR CORRECTING ERRORS IN POSITION-MEASURING DEVICES

INTERFERENTIAL POSITION-MEASURING DEVICE AND METHOD FOR OPERATING A...

Interferometer

OPTICAL POSITION MEASURING INSTRUMENT

Position-Measuring Device

Position-Measuring Device and System Having Such a Position-Measuri...

System and Method for Positioning a Processing Tool in Relation to...

System Having a Plurality of Scanning Units of a Position Measuring...

Position-Measuring Device and System Having a Plurality of Position...

Position measuring system

Method for attaching a scale to a carrier, a scale, and carrier hav...

Position-measuring device and method for operating a position-measu...

Position measuring system