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Joerg Franke

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  • Freiburg, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Magnetic field measuring device
    • Patent number 11,585,676
    • Issue date Feb 21, 2023
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Distance measuring device
    • Patent number 11,181,394
    • Issue date Nov 23, 2021
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Packaged IC component
    • Patent number 10,854,540
    • Issue date Dec 1, 2020
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Measuring system
    • Patent number 10,816,611
    • Issue date Oct 27, 2020
    • TDK-MICRONAS GMBH
    • Timo Kaufmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Calibration method for a hall effect sensor
    • Patent number 10,605,872
    • Issue date Mar 31, 2020
    • TDK-MICRONAS GMBH
    • Timo Kaufmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring system
    • Patent number 10,605,625
    • Issue date Mar 31, 2020
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Position determining sensor unit
    • Patent number 10,564,005
    • Issue date Feb 18, 2020
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic field compensation device
    • Patent number 10,473,733
    • Issue date Nov 12, 2019
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Test matrix adapter device
    • Patent number 10,436,817
    • Issue date Oct 8, 2019
    • TDK-MICRONAS GMBH
    • Timo Kaufmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Position determining unit
    • Patent number 10,429,209
    • Issue date Oct 1, 2019
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical component package with surface leads
    • Patent number 10,165,686
    • Issue date Dec 25, 2018
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    IC package
    • Patent number 10,026,684
    • Issue date Jul 17, 2018
    • TDK-MICRONAS GMBH
    • Klaus Heberle
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sensor device
    • Patent number 10,018,684
    • Issue date Jul 10, 2018
    • TDK-MICRONAS GMBH
    • Timo Kaufmann
    • F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
  • Information Patent Grant

    Sensor device
    • Patent number 10,006,969
    • Issue date Jun 26, 2018
    • TDK-MICRONAS GMBH
    • Timo Kaufmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,933,495
    • Issue date Apr 3, 2018
    • TDK-MICRONAS GMBH
    • Timo Kaufmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC package
    • Patent number 9,893,005
    • Issue date Feb 13, 2018
    • TDK-MICRONAS GMBH
    • Klaus Heberle
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Measurement device for determining angular position
    • Patent number 9,880,024
    • Issue date Jan 30, 2018
    • TDK-MICRONAS GMBH
    • Timo Kaufmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Injection-molded circuit carrier
    • Patent number 9,718,224
    • Issue date Aug 1, 2017
    • TDK-MICRONAS GMBH
    • Joerg Franke
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Grant

    Magnetic field measuring device
    • Patent number 9,645,203
    • Issue date May 9, 2017
    • Micronas GmbH
    • Timo Kaufmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic field measuring device
    • Patent number 9,551,764
    • Issue date Jan 24, 2017
    • Micronas GmbH
    • Joerg Franke
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Measuring system
    • Patent number 9,513,343
    • Issue date Dec 6, 2016
    • Micronas GmbH
    • Klaus Heberle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring system
    • Patent number 9,442,169
    • Issue date Sep 13, 2016
    • Micronas GmbH
    • Klaus Heberle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring system
    • Patent number 9,348,003
    • Issue date May 24, 2016
    • Micronas GmbH
    • Joachim Ritter
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring system
    • Patent number 9,341,463
    • Issue date May 17, 2016
    • Micronas GmbH
    • Joachim Ritter
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Circuit and measuring system
    • Patent number 9,279,702
    • Issue date Mar 8, 2016
    • Micronas GmbH
    • Joachim Ritter
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic field sensor device
    • Patent number 9,166,145
    • Issue date Oct 20, 2015
    • Micronas GmbH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Device for increasing the magnetic flux density
    • Patent number 9,153,772
    • Issue date Oct 6, 2015
    • Micronas GmbH
    • Joerg Franke
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Magnetic field sensor
    • Patent number 8,981,508
    • Issue date Mar 17, 2015
    • Micronas GmbH
    • Joerg Franke
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Integrated current sensor
    • Patent number 8,957,668
    • Issue date Feb 17, 2015
    • Micronas GmbH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor module and method for monitoring the function thereof
    • Patent number 8,878,529
    • Issue date Nov 4, 2014
    • Micronas GmbH
    • Dieter Baecher
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD AND DEVICE FOR TRANSFER LEARNING BETWEEN MODIFIED TASKS
    • Publication number 20220051138
    • Publication date Feb 17, 2022
    • ROBERT BOSCH GmbH
    • Danny Stoll
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    DISTANCE MEASURING DEVICE
    • Publication number 20190063953
    • Publication date Feb 28, 2019
    • TDK - Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Packaged IC Component
    • Publication number 20190013267
    • Publication date Jan 10, 2019
    • TDK - Micronas GmbH
    • Joerg Franke
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC FIELD COMPENSATION DEVICE
    • Publication number 20180321330
    • Publication date Nov 8, 2018
    • TDK - Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    CALIBRATION METHOD FOR A HALL EFFECT SENSOR
    • Publication number 20180172780
    • Publication date Jun 21, 2018
    • TDK - Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC PACKAGE
    • Publication number 20180130729
    • Publication date May 10, 2018
    • TDK - Micronas GmbH
    • Klaus HEBERLE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MEASURING SYSTEM
    • Publication number 20180031643
    • Publication date Feb 1, 2018
    • TDK - Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING SYSTEM
    • Publication number 20180031391
    • Publication date Feb 1, 2018
    • TDK - Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION DETERMINING UNIT
    • Publication number 20170254669
    • Publication date Sep 7, 2017
    • TDK - Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION DETERMINING SENSOR UNIT
    • Publication number 20170254668
    • Publication date Sep 7, 2017
    • TDK - Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST MATRIX ADAPTER DEVICE
    • Publication number 20170227578
    • Publication date Aug 10, 2017
    • TDK - Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC FIELD MEASURING DEVICE
    • Publication number 20170102250
    • Publication date Apr 13, 2017
    • Micronas GmbH
    • Joerg Franke
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC FIELD MEASURING DEVICE
    • Publication number 20160363637
    • Publication date Dec 15, 2016
    • Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC PACKAGE
    • Publication number 20160204055
    • Publication date Jul 14, 2016
    • Micronas GmbH
    • Klaus HEBERLE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INJECTION-MOLDED CIRCUIT CARRIER
    • Publication number 20160061634
    • Publication date Mar 3, 2016
    • Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC FIELD MEASURING DEVICE
    • Publication number 20160033587
    • Publication date Feb 4, 2016
    • Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL COMPONENT
    • Publication number 20160037641
    • Publication date Feb 4, 2016
    • Micronas GmbH
    • Joerg FRANKE
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150293185
    • Publication date Oct 15, 2015
    • Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150293184
    • Publication date Oct 15, 2015
    • Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150276893
    • Publication date Oct 1, 2015
    • Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT DEVICE
    • Publication number 20150260547
    • Publication date Sep 17, 2015
    • Micronas GmbH
    • Timo KAUFMANN
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC FIELD SENSOR DEVICE
    • Publication number 20140346579
    • Publication date Nov 27, 2014
    • Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING SYSTEM
    • Publication number 20140333298
    • Publication date Nov 13, 2014
    • Micronas GmbH
    • Klaus HEBERLE
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING SYSTEM
    • Publication number 20140333299
    • Publication date Nov 13, 2014
    • Micronas GmbH
    • Klaus HEBERLE
    • G01 - MEASURING TESTING
  • Information Patent Application

    CIRCUIT AND MEASURING SYSTEM
    • Publication number 20140197822
    • Publication date Jul 17, 2014
    • Micronas GmbH
    • Joachim RITTER
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING SYSTEM
    • Publication number 20140197820
    • Publication date Jul 17, 2014
    • Micronas GmbH
    • Joachim RITTER
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING SYSTEM
    • Publication number 20140197821
    • Publication date Jul 17, 2014
    • Micronas GmbH
    • Joachim RITTER
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC FIELD SENSOR
    • Publication number 20140159178
    • Publication date Jun 12, 2014
    • Micronas GmbH
    • Joerg FRANKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR AND METHOD FOR DETECTING A CURRENTLESS STATE
    • Publication number 20130099781
    • Publication date Apr 25, 2013
    • Micronas GmbH
    • Klaus HEBERLE
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTEGRATED CURRENT SENSOR
    • Publication number 20130015839
    • Publication date Jan 17, 2013
    • Joerg Franke
    • G01 - MEASURING TESTING