Joerg Georg Appinger

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Aidlingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Wafer probe alignment
- Patent number 9,977,053
- Issue date May 22, 2018
- International Business Machines Corporation
- Joerg G. Appinger
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe alignment
- Patent number 9,927,463
- Issue date Mar 27, 2018
- International Business Machines Corporation
- Joerg G. Appinger
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for coding test pattern for scan design
- Patent number 7,225,376
- Issue date May 29, 2007
- International Business Machines Corporation
- Joerg Georg Appinger
- G01 - MEASURING TESTING
Information Patent Grant
Random pattern weight control by pseudo random bit pattern generato...
- Patent number 6,983,407
- Issue date Jan 3, 2006
- International Business Machines Corporation
- Joerg Georg Appinger
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
WAFER PROBE ALIGNMENT
- Publication number 20170108547
- Publication date Apr 20, 2017
- International Business Machines Corporation
- Joerg G. APPINGER
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE ALIGNMENT
- Publication number 20170108534
- Publication date Apr 20, 2017
- International Business Machines Corporation
- Joerg G. APPINGER
- G01 - MEASURING TESTING
Information Patent Application
Method and system for coding test pattern for scan design
- Publication number 20040064771
- Publication date Apr 1, 2004
- International Business Machines Corporation
- Joerg Georg Appinger
- G01 - MEASURING TESTING
Information Patent Application
Random pattern weight control by pseudo random bit pattern generato...
- Publication number 20030233607
- Publication date Dec 18, 2003
- International Business Machines Corporation
- Joerg Georg Appinger
- H03 - BASIC ELECTRONIC CIRCUITRY