Joerg KAERCHER

Person

Madison, WI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for the detection and correction of lens distortions in an e...
- Patent number 12,078,603
- Issue date Sep 3, 2024
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Indirect photon-counting analytical X-ray detector
- Patent number 10,408,949
- Issue date Sep 10, 2019
- Hao Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting timing skew in X-ray data read out of an X-ra...
- Patent number 9,784,698
- Issue date Oct 10, 2017
- Roger D. Durst
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray diffraction based crystal centering method using an active pi...
- Patent number 9,417,196
- Issue date Aug 16, 2016
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Method of conducting an X-ray diffraction-based crystallography ana...
- Patent number 9,372,163
- Issue date Jun 21, 2016
- Michael Ruf
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction-based defective pixel correction method using an...
- Patent number 9,022,651
- Issue date May 5, 2015
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting timing skew in X-ray data read out of an X-ra...
- Patent number 8,903,043
- Issue date Dec 2, 2014
- Bruker AXS, Inc.
- Roger D Durst
- G01 - MEASURING TESTING
Information Patent Grant
Multiply-sampled CMOS sensor for X-ray diffraction measurements wit...
- Patent number 8,680,473
- Issue date Mar 25, 2014
- Bruker AXS, Inc.
- Roger D Durst
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...
- Publication number 20220317068
- Publication date Oct 6, 2022
- Bruker AXS, LLC
- Joerg KAERCHER
- G01 - MEASURING TESTING
Information Patent Application
INDIRECT PHOTON-COUNTING ANALYTICAL X-RAY DETECTOR
- Publication number 20190056514
- Publication date Feb 21, 2019
- Bruker AXS, Inc.
- Hao JIANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONDUCTING AN X-RAY DIFFRACTION-BASED CRYSTALLOGRAPHY ANA...
- Publication number 20150276629
- Publication date Oct 1, 2015
- Bruker AXS, Inc.
- Michael RUF
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION BASED CRYSTAL CENTERING METHOD USING AN ACTIVE PI...
- Publication number 20150103980
- Publication date Apr 16, 2015
- Bruker AXS Inc.
- Joerg KAERCHER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING TIMING SKEW IN X-RAY DATA READ OUT OF AN X-RA...
- Publication number 20150046112
- Publication date Feb 12, 2015
- Bruker AXS, Inc.
- Roger D. DURST
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION-BASED DEFECTIVE PIXEL CORRECTION METHOD USING AN...
- Publication number 20150016594
- Publication date Jan 15, 2015
- Bruker AXS, Inc.
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLY-SAMPLED CMOS SENSOR FOR X-RAY DIFFRACTION MEASUREMENTS WIT...
- Publication number 20130108021
- Publication date May 2, 2013
- Bruker AXS, Inc.
- Roger D. DURST
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING TIMING SKEW IN X-RAY DATA READ OUT OF AN X-RA...
- Publication number 20130103339
- Publication date Apr 25, 2013
- Bruker AXS, Inc.
- Roger D. DURST
- G01 - MEASURING TESTING

Joerg KAERCHER

Person

Patents Grantslast 30 patents

Method for the detection and correction of lens distortions in an e...

Indirect photon-counting analytical X-ray detector

Method for correcting timing skew in X-ray data read out of an X-ra...

X-ray diffraction based crystal centering method using an active pi...

Method of conducting an X-ray diffraction-based crystallography ana...

X-ray diffraction-based defective pixel correction method using an...

Method for correcting timing skew in X-ray data read out of an X-ra...

Multiply-sampled CMOS sensor for X-ray diffraction measurements wit...

Patents Applicationslast 30 patents

METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...

INDIRECT PHOTON-COUNTING ANALYTICAL X-RAY DETECTOR

METHOD OF CONDUCTING AN X-RAY DIFFRACTION-BASED CRYSTALLOGRAPHY ANA...

X-RAY DIFFRACTION BASED CRYSTAL CENTERING METHOD USING AN ACTIVE PI...

METHOD FOR CORRECTING TIMING SKEW IN X-RAY DATA READ OUT OF AN X-RA...

X-RAY DIFFRACTION-BASED DEFECTIVE PIXEL CORRECTION METHOD USING AN...

MULTIPLY-SAMPLED CMOS SENSOR FOR X-RAY DIFFRACTION MEASUREMENTS WIT...

METHOD FOR CORRECTING TIMING SKEW IN X-RAY DATA READ OUT OF AN X-RA...