Joerg Kiesewetter

Person

Thiendorf OT Sacka, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 9,395,411
- Issue date Jul 19, 2016
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 8,497,693
- Issue date Jul 30, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder
- Patent number 8,402,848
- Issue date Mar 26, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for focusing a multiplane image acquisition...
- Patent number 8,072,586
- Issue date Dec 6, 2011
- Cascade Microtech, Inc.
- Michael Teich
- G02 - OPTICS
Information Patent Grant
Device for testing thin elements
- Patent number 7,282,930
- Issue date Oct 16, 2007
- SUSS MicroTec Test Systems GmbH
- Uwe Beier
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reproduction of a calibration position of an aligned...
- Patent number 7,265,536
- Issue date Sep 4, 2007
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station comprising a bellows with EMI shielding capabilities
- Patent number 7,235,990
- Issue date Jun 26, 2007
- SUSS MicroTec Test Systems GmbH
- Stefan Kreissig
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20140028337
- Publication date Jan 30, 2014
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
- Publication number 20110013011
- Publication date Jan 20, 2011
- SUSS MicroTec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
PROBE HOLDER
- Publication number 20100294053
- Publication date Nov 25, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20100289511
- Publication date Nov 18, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
- Publication number 20080212078
- Publication date Sep 4, 2008
- SUSS Micro Tec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
Device for testing thin elements
- Publication number 20070139067
- Publication date Jun 21, 2007
- SUSS MicroTec Test Systems GmbH
- Uwe Beier
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION COMPRISING A BELLOWS WITH EMI SHIELDING CAPABILITIES
- Publication number 20070132465
- Publication date Jun 14, 2007
- SUSS MicroTec Test Systems GmbH
- Stefan Kreissig
- G01 - MEASURING TESTING
Information Patent Application
Procedure for reproduction of a calibration position of an aligned...
- Publication number 20060212248
- Publication date Sep 21, 2006
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING

Joerg Kiesewetter

Person

Patents Grantslast 30 patents

Method for testing a test substrate under defined thermal condition...

Method for testing a test substrate under defined thermal condition...

Probe holder

Arrangement and method for focusing a multiplane image acquisition...

Device for testing thin elements

Procedure for reproduction of a calibration position of an aligned...

Probe station comprising a bellows with EMI shielding capabilities

Patents Applicationslast 30 patents

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...

PROBE HOLDER

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...

Device for testing thin elements

PROBE STATION COMPRISING A BELLOWS WITH EMI SHIELDING CAPABILITIES

Procedure for reproduction of a calibration position of an aligned...