Joerg Krause

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Freiburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Manufacture of defect cards for semiconductor dies
- Patent number 8,143,076
- Issue date Mar 27, 2012
- Micronas GmbH
- Hans-Guenter Zimmer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MANUFACTURE OF DEFECT CARDS FOR SEMICONDUCTOR DIES
- Publication number 20100297785
- Publication date Nov 25, 2010
- Hans Guenter-Zimmer
- G01 - MEASURING TESTING