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Joerg Lindenau
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Jena, DE
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last 30 patents
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Patent Grant
Method and arrangement for analyzing samples
Patent number
7,420,674
Issue date
Sep 2, 2008
Carl Zeiss MicroImaging GmbH
Volker Gerstner
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and arrangement for analyzing samples
Publication number
20050179892
Publication date
Aug 18, 2005
Volker Gerstner
G02 - OPTICS