Joern Kamps

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for characterizing a sample with two or more o...
- Patent number 8,415,613
- Issue date Apr 9, 2013
- JPK Instruments AG
- Sven-Peter Heyn
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Characterizing a Sample with Two or More O...
- Publication number 20100251437
- Publication date Sep 30, 2010
- JPK INSTRUMENTS AG
- Sven-Peter Heyn
- G02 - OPTICS