Joey Dean Evans

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San Antonio, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for electrically testing semiconductor devices...
- Patent number 6,259,261
- Issue date Jul 10, 2001
- Sony Corporation
- Steven Engelking
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for polishing electrical probes
- Patent number 6,203,411
- Issue date Mar 20, 2001
- Sony Corporation
- Steven Engelking
- B24 - GRINDING POLISHING
Information Patent Grant
Integrated testing method and apparatus for semiconductor test oper...
- Patent number 6,137,303
- Issue date Oct 24, 2000
- Sony Corporation
- Richard Allan Deckert
- G01 - MEASURING TESTING