Johan de Vries

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Almelo, NL

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Patents Grantslast 30 patents

Information Patent Grant
Digital oscilloscope with trigger qualification based on pattern re...
- Patent number 6,621,913
- Issue date Sep 16, 2003
- Fluke Corporation
- Johan de Vries
- G01 - MEASURING TESTING
Information Patent Grant
Method of signal analysis employing histograms to establish stable,...
- Patent number 5,495,168
- Issue date Feb 27, 1996
- Fluke Corporation
- Johan de Vries
- G01 - MEASURING TESTING