Johan DeGreeve

Person

Leuven, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for optical three dimensional topography measurement
- Patent number 11,287,248
- Issue date Mar 29, 2022
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic confocal area sensor
- Patent number 10,866,092
- Issue date Dec 15, 2020
- KLA-Tencor Corporation
- Christophe Wouters
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical three dimensional topography measurement
- Patent number 10,634,487
- Issue date Apr 28, 2020
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system, inspection tool with illumination system, and...
- Patent number 10,379,057
- Issue date Aug 13, 2019
- KLA-Tencor Corporation
- Filip Cauwenberghs
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for shape classification of an object
- Patent number 10,215,560
- Issue date Feb 26, 2019
- KLA-Tencor Corporation
- Laurent Hermans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image acquisition system, image acquisition method, and inspection...
- Patent number 9,886,764
- Issue date Feb 6, 2018
- KLA-Tencor Corporation
- Guoheng Zhao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for illuminating substrates in order to image micro crack...
- Patent number 9,255,893
- Issue date Feb 9, 2016
- KLA-Tencor Corporation
- Wojciech Grzegorczyk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and methods for setting up optical inspection parameters
- Patent number 8,830,454
- Issue date Sep 9, 2014
- KLA-Tencor Corporation
- Johan De Greeve
- G01 - MEASURING TESTING
Information Patent Grant
Detecting semiconductor substrate anomalies
- Patent number 8,379,964
- Issue date Feb 19, 2013
- KLA-Tencor Corporation
- Dominque Janssens
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Optical Three Dimensional Topography Measurement
- Publication number 20200217651
- Publication date Jul 9, 2020
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL AREA SENSOR
- Publication number 20200033121
- Publication date Jan 30, 2020
- KLA-Tencor Corporation
- Christophe Wouters
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Optical Three Dimensional Topography Measurement
- Publication number 20180209784
- Publication date Jul 26, 2018
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SHAPE CLASSIFICATION OF AN OBJECT
- Publication number 20160282111
- Publication date Sep 29, 2016
- KLA-Tencor Corporation
- Laurent Hermans
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM, INSPECTION TOOL WITH ILLUMINATION SYSTEM, AND...
- Publication number 20160123892
- Publication date May 5, 2016
- KLA-Tencor Corporation
- Filip Cauwenberghs
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ACQUISITION SYSTEM, IMAGE ACQUISITION METHOD, AND INSPECTION...
- Publication number 20160048969
- Publication date Feb 18, 2016
- KLA-Tencor Corporation
- Guoheng ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD TO ESTIMATE THE POTENTIAL EFFICIENCY OF A POLY...
- Publication number 20130100275
- Publication date Apr 25, 2013
- KLA-Tencor Corporation
- Johan DeGreeve
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING EFFICIENCY IMPACT OF INTERRUPT...
- Publication number 20130035881
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Choon (George) Hoong Hoo
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ILLUMINATING SUBSTRATES IN ORDER TO IMAGE MICRO CRACK...
- Publication number 20120262566
- Publication date Oct 18, 2012
- KLA-Tencor Corporation
- Wojciech Grzegorczyk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR SETTING UP OPTICAL INSPECTION PARAMETERS
- Publication number 20110255081
- Publication date Oct 20, 2011
- KLA-Tencor Corporation
- Johan De Greeve
- G01 - MEASURING TESTING
Information Patent Application
Detecting Semiconductor Substrate Anomalies
- Publication number 20110123091
- Publication date May 26, 2011
- ICOS VISION SYSTEMS NV
- Dominque Janssens
- G06 - COMPUTING CALCULATING COUNTING

Johan DeGreeve

Person

Patents Grantslast 30 patents

Method and system for optical three dimensional topography measurement

Chromatic confocal area sensor

Method and system for optical three dimensional topography measurement

Illumination system, inspection tool with illumination system, and...

Method for shape classification of an object

Image acquisition system, image acquisition method, and inspection...

Apparatus for illuminating substrates in order to image micro crack...

Apparatus and methods for setting up optical inspection parameters

Detecting semiconductor substrate anomalies

Patents Applicationslast 30 patents

Method and System for Optical Three Dimensional Topography Measurement

CHROMATIC CONFOCAL AREA SENSOR

Method and System for Optical Three Dimensional Topography Measurement

METHOD FOR SHAPE CLASSIFICATION OF AN OBJECT

ILLUMINATION SYSTEM, INSPECTION TOOL WITH ILLUMINATION SYSTEM, AND...

IMAGE ACQUISITION SYSTEM, IMAGE ACQUISITION METHOD, AND INSPECTION...

APPARATUS AND METHOD TO ESTIMATE THE POTENTIAL EFFICIENCY OF A POLY...

METHOD AND SYSTEM FOR CHARACTERIZING EFFICIENCY IMPACT OF INTERRUPT...

APPARATUS FOR ILLUMINATING SUBSTRATES IN ORDER TO IMAGE MICRO CRACK...

APPARATUS AND METHODS FOR SETTING UP OPTICAL INSPECTION PARAMETERS

Detecting Semiconductor Substrate Anomalies