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Johan Enmanuel Gonzalez
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El Segundo, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Bistatic inverse synthetic aperture radar imaging
Patent number
9,335,409
Issue date
May 10, 2016
Raytheon Company
Theagenis J. Abatzoglou
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced radar range resolution
Patent number
9,103,918
Issue date
Aug 11, 2015
Raytheon Company
Theagenis J. Abatzoglou
G01 - MEASURING TESTING
Information
Patent Grant
Reduction of CFAR false alarms via classification and segmentation...
Patent number
8,977,062
Issue date
Mar 10, 2015
Raytheon Company
Johan Enmanuel Gonzalez
G01 - MEASURING TESTING
Information
Patent Grant
On-board INS quadratic correction method using maximum likelihood m...
Patent number
8,816,896
Issue date
Aug 26, 2014
Raytheon Company
Theagenis J. Abatzoglou
G01 - MEASURING TESTING
Information
Patent Grant
Fast implementation of a maximum likelihood algorithm for the estim...
Patent number
7,969,345
Issue date
Jun 28, 2011
Raytheon Company
Theagenis J. Abatzoglou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BISTATIC INVERSE SYNTHETIC APERTURE RADAR IMAGING
Publication number
20140285371
Publication date
Sep 25, 2014
Theagenis J. Abatzoglou
G01 - MEASURING TESTING
Information
Patent Application
REDUCTION OF CFAR FALSE ALARMS VIA CLASSIFICATION AND SEGMENTATION...
Publication number
20140241639
Publication date
Aug 28, 2014
Raytheon Company
Johan Enmanuel Gonzalez
G01 - MEASURING TESTING
Information
Patent Application
ENHANCED RADAR RANGE RESOLUTION
Publication number
20140218231
Publication date
Aug 7, 2014
Raytheon Company
Theagenis J. Abatzoglou
G01 - MEASURING TESTING
Information
Patent Application
On-Board INS Quadratic Correction Method Using Maximum Likelihood M...
Publication number
20130300599
Publication date
Nov 14, 2013
Raytheon Company
Theagenis J. Abatzoglou
G01 - MEASURING TESTING
Information
Patent Application
FAST IMPLEMENTATION OF A MAXIMUM LIKELIHOOD ALGORITHM FOR THE ESTIM...
Publication number
20100259442
Publication date
Oct 14, 2010
Theagenis J. Abatzoglou
G01 - MEASURING TESTING