Johann Greschner

Person

Pliezhausen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle-optical systems, methods and components
- Patent number 8,039,813
- Issue date Oct 18, 2011
- Carl Zeiss SMT GmbH
- Antonio Casares
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe arrangement
- Patent number 6,356,089
- Issue date Mar 12, 2002
- International Business Machines Corporation
- Thomas Bayer
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing a calibration standard for 2-D and 3-D profilom...
- Patent number 6,218,264
- Issue date Apr 17, 2001
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromechanical sensor for AFM/STM profilometry
- Patent number 6,091,124
- Issue date Jul 18, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micro-mechanically fabricated read/write head with a strengthening...
- Patent number 6,088,320
- Issue date Jul 11, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for fabricating a very dense chip package
- Patent number 6,087,199
- Issue date Jul 11, 2000
- International Business Machines Corporation
- H. Bernhard Pogge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion generator for ionographic print heads
- Patent number 6,061,074
- Issue date May 9, 2000
- International Business Machines Corporation
- Johann Bartha
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Calibration standard for profilometers and manufacturing procedure
- Patent number 6,028,008
- Issue date Feb 22, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Membrane mask for electron beam lithography
- Patent number 6,004,700
- Issue date Dec 21, 1999
- International Business Machines Corporation
- Johann Greschner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Very dense chip package
- Patent number 5,998,868
- Issue date Dec 7, 1999
- International Business Machines Corporation
- H. Bernhard Pogge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,960,255
- Issue date Sep 28, 1999
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Contact probe arrangement for functional electrical testing
- Patent number 5,939,893
- Issue date Aug 17, 1999
- International Business Machines Corporation
- Gerhard Elsner
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method for membrane lithography mask with mask fields
- Patent number 5,935,739
- Issue date Aug 10, 1999
- International Business Machines Corporation
- Thomas Bayer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Very dense integrated circuit package and method for forming the same
- Patent number 5,866,443
- Issue date Feb 2, 1999
- International Business Machines Corporation
- H. Bernhard Pogge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adhesive bond for densely ordered elements
- Patent number 5,863,636
- Issue date Jan 26, 1999
- International Business Machines Corporation
- Frank Druschke
- G01 - MEASURING TESTING
Information Patent Grant
Process for the creation of a thermal SiO.sub.2 layer with extremel...
- Patent number 5,817,581
- Issue date Oct 6, 1998
- International Business Machines Corporation
- Thomas Bayer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a field emission device
- Patent number 5,817,201
- Issue date Oct 6, 1998
- International Business Machines Corporation
- Johann Greschner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Very dense integrated circuit package
- Patent number 5,814,885
- Issue date Sep 29, 1998
- International Business Machines Corporation
- H. Bernhard Pogge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a field emission device
- Patent number 5,791,959
- Issue date Aug 11, 1998
- International Business Machines Corporation
- Johann Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Resonant sensor for determining multiple physical values
- Patent number 5,789,666
- Issue date Aug 4, 1998
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Field emission device with series resistor tip and method of manufa...
- Patent number 5,783,905
- Issue date Jul 21, 1998
- International Business Machines Corporation
- Johann Greschner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Very dense integrated circuit package
- Patent number 5,770,884
- Issue date Jun 23, 1998
- International Business Machines Corporation
- H. Bernhard Pogge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission device and method for fabricating it
- Patent number 5,717,278
- Issue date Feb 10, 1998
- International Business Machines Corporation
- Johann Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Bulk removal, transport and storage fixture for small batch-fabrica...
- Patent number 5,707,537
- Issue date Jan 13, 1998
- International Business Machines Corporation
- Johann Bartha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,665,905
- Issue date Sep 9, 1997
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for producing deep vertical structures in silicon substrates
- Patent number 5,658,472
- Issue date Aug 19, 1997
- International Business Machines Corporation
- Johann Bartha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force microscope and method for measuring atomic forces in multiple...
- Patent number 5,646,339
- Issue date Jul 8, 1997
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for producing a multi-step structure in a substrate
- Patent number 5,641,610
- Issue date Jun 24, 1997
- International Business Machines Corporation
- Johann Bartha
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for producing a multi-step structure in a substrate
- Patent number 5,635,337
- Issue date Jun 3, 1997
- International Business Machines
- Johann Bartha
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration standards for profilometers and methods of producing them
- Patent number 5,578,745
- Issue date Nov 26, 1996
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Particle-Optical Component
- Publication number 20090114818
- Publication date May 7, 2009
- Carl Zeiss SMT AG
- Antonio Casares
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT PROBE ARRANGEMENT
- Publication number 20010011896
- Publication date Aug 9, 2001
- THOMAS BAYER
- G01 - MEASURING TESTING

Johann Greschner

Person

Patents Grantslast 30 patents

Charged particle-optical systems, methods and components

Contact probe arrangement

Method of producing a calibration standard for 2-D and 3-D profilom...

Micromechanical sensor for AFM/STM profilometry

Micro-mechanically fabricated read/write head with a strengthening...

Method for fabricating a very dense chip package

Ion generator for ionographic print heads

Calibration standard for profilometers and manufacturing procedure

Membrane mask for electron beam lithography

Very dense chip package

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Contact probe arrangement for functional electrical testing

Manufacturing method for membrane lithography mask with mask fields

Very dense integrated circuit package and method for forming the same

Adhesive bond for densely ordered elements

Process for the creation of a thermal SiO.sub.2 layer with extremel...

Method of fabricating a field emission device

Very dense integrated circuit package

Method of fabricating a field emission device

Resonant sensor for determining multiple physical values

Field emission device with series resistor tip and method of manufa...

Very dense integrated circuit package

Field emission device and method for fabricating it

Bulk removal, transport and storage fixture for small batch-fabrica...

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Method for producing deep vertical structures in silicon substrates

Force microscope and method for measuring atomic forces in multiple...

Method for producing a multi-step structure in a substrate

Method for producing a multi-step structure in a substrate

Calibration standards for profilometers and methods of producing them

Patents Applicationslast 30 patents

Particle-Optical Component

CONTACT PROBE ARRANGEMENT