Johann L. Maul

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Indersdorf, DE

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Patents Grantslast 30 patents

Information Patent Grant
Secondary ion mass spectrometer with aperture mask
- Patent number 6,080,986
- Issue date Jun 27, 2000
- Atomika Instruments GmbH
- Mark Graeme Dowsett
- G01 - MEASURING TESTING
Information Patent Grant
Process for analysis of a sample
- Patent number 6,078,045
- Issue date Jun 20, 2000
- Atomika Instruments GmbH
- Johann L. Maul
- G01 - MEASURING TESTING