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Johann Otto
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Munich, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Inductive component and use of said component
Patent number
7,508,290
Issue date
Mar 24, 2009
Siemens Aktiengesellschaft
Martin Honsberg-Riedl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam measuring instrument
Patent number
4,963,823
Issue date
Oct 16, 1990
Siemens Aktiengesellschaft
Johann Otto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for operating a scanning microscope
Patent number
4,902,966
Issue date
Feb 20, 1990
Siemens Aktiengesellschaft
Hans-Detlef Brust
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and apparatus for operating a scanning microscope
Patent number
4,812,748
Issue date
Mar 14, 1989
Siemens Aktiengesellschaft
Hans-Detlef Brust
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and arrangement for evaluating a test voltage by means of a...
Patent number
4,780,669
Issue date
Oct 25, 1988
Siemens Aktiengesellschaft
Hans D. Brust
G01 - MEASURING TESTING
Information
Patent Grant
Method for the determination of points on a specimen carrying a spe...
Patent number
4,689,555
Issue date
Aug 25, 1987
Siemens Aktiengesellschaft
Hans-Detlef Brust
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for preventing burn-in spots on the picture screen of a vis...
Patent number
4,677,351
Issue date
Jun 30, 1987
Siemens Aktiengesellschaft
Hans-Detlef Brust
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for localizing weak points within an electrica...
Patent number
4,640,626
Issue date
Feb 3, 1987
Siemens Aktiengesellschaft
Ralf Schmid
G01 - MEASURING TESTING
Information
Patent Grant
Method of emphasizing a subject area in a scanning microscope
Patent number
4,611,119
Issue date
Sep 9, 1986
Siemens Aktiengesellschaft
Peter Fazekas
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for representing logical status changes of a plurality of ad...
Patent number
4,471,302
Issue date
Sep 11, 1984
Siemens Aktiengesellschaft
Peter Fazekas
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning electron microscope
Patent number
4,241,259
Issue date
Dec 23, 1980
Siemens Aktiengesellschaft
Hans P. Feuerbaum
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Inductive component and use of said component
Publication number
20050206487
Publication date
Sep 22, 2005
Martin Honsberg-Riedl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrical circuit arrangement comprised of a number of electricall...
Publication number
20040246683
Publication date
Dec 9, 2004
Martin Honsberg-Riedl
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR