Johann Pötzinger

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Fischbachau, DE

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for removing tested semiconductor components
- Patent number 9,014,841
- Issue date Apr 21, 2015
- Multitest Elektronishche Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SOCKET FOR AND A METHOD OF TESTING ELECTRONIC COMPONENTS, IN P...
- Publication number 20240168055
- Publication date May 23, 2024
- Cohu GmbH
- Stefan ENGELBRECHT
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20230073230
- Publication date Mar 9, 2023
- Cohu GmbH
- Markus WAGNER
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR REMOVING TESTED SEMICONDUCTOR COMPONENTS
- Publication number 20130338818
- Publication date Dec 19, 2013
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
CENTERING DEVICE FOR ELECTRONIC COMPONENTS, PARTICULARLY ICS
- Publication number 20100164482
- Publication date Jul 1, 2010
- Multitest elektronische Systeme GmbH
- Johann Pötzinger
- G01 - MEASURING TESTING