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Johannes Anna QUAEDACKERS
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Veldhove, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for measuring a height map of a surface of an obj...
Patent number
11,466,976
Issue date
Oct 11, 2022
Mitutoyo Corporation
Johannes Anna Quaedackers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Lithographic apparatus and device manufacturing method involving a...
Patent number
11,378,893
Issue date
Jul 5, 2022
ASML Netherlands B.V.
Theodorus Petrus Maria Cadee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and device manufacturing method involving a...
Patent number
10,838,310
Issue date
Nov 17, 2020
ASML Netherlands B.V.
Theodorus Petrus Maria Cadee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and system for calculating a height map of a surface of an o...
Patent number
10,636,157
Issue date
Apr 28, 2020
Mitutoyo Corporation
Johannes Anna Quaedackers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for measuring a height map of multiple fields of view and co...
Patent number
10,563,974
Issue date
Feb 18, 2020
Mitutoyo Corporation
Johannes Anna Quaedackers
G01 - MEASURING TESTING
Information
Patent Grant
Method for calculating a height map of a body of transparent materi...
Patent number
10,302,415
Issue date
May 28, 2019
Mitutoyo Corporation
Johannes Anna Quaedackers
G01 - MEASURING TESTING
Information
Patent Grant
Lithographic apparatus and device manufacturing method involving a...
Patent number
10,254,663
Issue date
Apr 9, 2019
ASML Netherlands B.V.
Theodorus Petrus Maria Cadee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Interference measuring device and method of measurement using the s...
Patent number
10,024,648
Issue date
Jul 17, 2018
Mitutoyo Corporation
Tatsuya Nagahama
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring a high accuracy height map of a test surface
Patent number
9,881,400
Issue date
Jan 30, 2018
Mitutoyo Corporation
Adriaan Tiemen Zuiderweg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Lithographic focus and dose measurement using a 2-D target
Patent number
9,436,099
Issue date
Sep 6, 2016
ASML Netherlands B.V.
Christian Marinus Leewis
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and device manufacturing method involving a...
Patent number
9,268,242
Issue date
Feb 23, 2016
ASML Netherlands B.V.
Theodorus Petrus Maria Cadee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and device manufacturing method involving a...
Patent number
9,188,880
Issue date
Nov 17, 2015
ASML Netherlands B.V.
Theodorus Petrus Maria Cadee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for determining a property of a surface
Patent number
9,103,651
Issue date
Aug 11, 2015
Mitutoyo Corporation
Han Haitjema
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for overlay measurement
Patent number
8,982,328
Issue date
Mar 17, 2015
ASML Netherlands B.V.
Henricus Johannes Lambertus Megens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic focus and dose measurement using a 2-D target
Patent number
8,891,061
Issue date
Nov 18, 2014
ASML Netherlands B.V.
Christian Marinus Leewis
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of measuring a characteristic
Patent number
8,685,626
Issue date
Apr 1, 2014
ASML Netherlands B.V.
Johannes Anna Quaedackers
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of determining a characteristic
Patent number
8,502,955
Issue date
Aug 6, 2013
ASML Netherlands B.V.
Henricus Johannes Lambertus Megens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of inspecting a substrate and method of preparing a substrat...
Patent number
8,435,593
Issue date
May 7, 2013
ASML Netherlands B.V.
Rik Teodoor Vangheluwe
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic method
Patent number
8,119,333
Issue date
Feb 21, 2012
ASML Netherlands B.V.
Eddy Cornelis Antonius Van Der Heijden
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Overlay measurement on double patterning substrate
Patent number
7,992,115
Issue date
Aug 2, 2011
ASML Netherlands B.V.
Eddy Cornelis Antonius Van Der Heijden
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and device manufacturing method having liqui...
Patent number
7,804,575
Issue date
Sep 28, 2010
ASML Netherlands B.V.
Theodorus Petrus Maria Cadee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for exposing a substrate and lithographic projection apparatus
Patent number
7,670,731
Issue date
Mar 2, 2010
ASML Netherlands B.V.
Jozef Maria Finders
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Device manufacturing method and computer program product
Patent number
7,596,420
Issue date
Sep 29, 2009
ASML Netherlands B.V.
Antoine Gaston Marie Kiers
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and device manufacturing method
Patent number
7,382,438
Issue date
Jun 3, 2008
ASML Netherlands B.V.
Hans Van Der Laan
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus, device manufacturing method and substrate
Patent number
7,307,687
Issue date
Dec 11, 2007
ASML Netherlands B.V.
Johannes Anna Quaedackers
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD INVOLVING A...
Publication number
20210063898
Publication date
Mar 4, 2021
ASML NETHERLANDS B.V.
Theodorus Petrus Maria CADEE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD INVOLVING A...
Publication number
20190235397
Publication date
Aug 1, 2019
ASML NETHERLANDS B.V.
Theodorus Petrus Maria CADEE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING A HEIGHT MAP OF A SURFACE OF AN OBJ...
Publication number
20190219380
Publication date
Jul 18, 2019
MITUTOYO CORPORATION
Johannes Anna QUAEDACKERS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR CALCULATING A HEIGHT MAP OF A SURFACE OF AN O...
Publication number
20180315207
Publication date
Nov 1, 2018
MITUTOYO CORPORATION
Johannes Anna Quaedackers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERFEROMETER SYSTEM HAVING A CONTINUOUSLY VARIABLE BROADBAND REFL...
Publication number
20180031415
Publication date
Feb 1, 2018
MITUTOYO CORPORATION
Han HAITJEMA
G02 - OPTICS
Information
Patent Application
INTERFERENCE MEASURING DEVICE AND METHOD OF MEASUREMENT USING THE S...
Publication number
20170363411
Publication date
Dec 21, 2017
Mitutoyo Corporation
Tatsuya Nagahama
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING A HEIGHT MAP OF MULTIPLE FIELDS OF VIEW AND CO...
Publication number
20170052018
Publication date
Feb 23, 2017
MITUTOYO CORPORATION
Johannes Anna QUAEDACKERS
G01 - MEASURING TESTING
Information
Patent Application
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD INVOLVING A...
Publication number
20160048085
Publication date
Feb 18, 2016
ASML NETHERLANDS B.V.
Theodorus Petrus Maria CADEE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR MEASURING A HIGH ACCURACY HEIGHT MAP OF A TEST SURFACE
Publication number
20160027194
Publication date
Jan 28, 2016
MITUTOYO CORPORATION
Adriaan Tiemen ZUIDERWEG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALCULATING A HEIGHT MAP OF A BODY OF TRANSPARENT MATERI...
Publication number
20150362309
Publication date
Dec 17, 2015
MITUTOYO CORPORATION
Johannes Anna QUAEDACKERS
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER SYSTEM AND METHOD TO GENERATE AN INTERFERENCE SIGNAL...
Publication number
20140362383
Publication date
Dec 11, 2014
MITUTOYO CORPORATION
Han HAITJEMA
G02 - OPTICS
Information
Patent Application
Lithographic Focus and Dose Measurement Using A 2-D Target
Publication number
20140247434
Publication date
Sep 4, 2014
ASML NETHERLANDS B.V.
Christian Marinus LEEWIS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Measuring a Characteristic
Publication number
20140199634
Publication date
Jul 17, 2014
ASML NETHERLANDS B.V.
Johannes Anna QUAEDACKERS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR DETERMINING A PROPERTY OF A SURFACE
Publication number
20130335747
Publication date
Dec 19, 2013
Han HAITJEMA
G01 - MEASURING TESTING
Information
Patent Application
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
Publication number
20120113402
Publication date
May 10, 2012
ASML NETHERLANDS B.V.
Theodorus Petrus Maria CADEE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic Focus and Dose Measurement Using A 2-D Target
Publication number
20110249244
Publication date
Oct 13, 2011
ASML NETHERLANDS B.V.
Christian Marinus Leewis
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method and Apparatus for Overlay Measurement
Publication number
20110141450
Publication date
Jun 16, 2011
ASML NETHERLANDS B.V.
Henricus Johannes Lambertus Megens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Producing a Marker Pattern and Measurement of an Exposure-Related P...
Publication number
20100328636
Publication date
Dec 30, 2010
ASML NETHERLANDS B.V.
Johannes Anna Quaedackers
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
Publication number
20100321650
Publication date
Dec 23, 2010
ASML NETHERLANDS B.V.
THEODORUS PETRUS MARIA CADEE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Measuring a Characteristic
Publication number
20100227280
Publication date
Sep 9, 2010
ASML NETHERLANDS B.V.
Johannes Anna Quaedackers
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Determining a Characteristic
Publication number
20100165312
Publication date
Jul 1, 2010
ASML NETHERLANDS B.V.
Henricus Johannes Lambertus Megens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic Method
Publication number
20090148796
Publication date
Jun 11, 2009
ASML NETHERLANDS B.V.
Eddy Cornelis Antonius VAN DER HEIJDEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Overlay Measurement on Double Patterning Substrate
Publication number
20090100391
Publication date
Apr 16, 2009
ASML NETHERLANDS B.V.
Eddy Cornelis Antonius VAN DER HEIJDEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of inspecting a substrate and method of preparing a substrat...
Publication number
20080292780
Publication date
Nov 27, 2008
ASML NETHERLANDS B.V.
Rik Teodoor Vangheluwe
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic device manufacturing method, lithographic cell, and co...
Publication number
20080160458
Publication date
Jul 3, 2008
ASML NETHERLANDS B.V.
Koen Van Ingen Schenau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Device manufacturing method and computer program product
Publication number
20070293973
Publication date
Dec 20, 2007
ASML NETHERLANDS B.V.
Antoine Gaston Marie Kiers
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic apparatus, device manufacturing method and substrate
Publication number
20070216883
Publication date
Sep 20, 2007
ASML NETHERLANDS B.V.
Johannes Anna Quaedackers
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method for exposing a substrate and lithographic projection apparatus
Publication number
20070099100
Publication date
May 3, 2007
ASML NETHERLANDS B.V.
Jozef Maria Finders
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic apparatus and device manufacturing method
Publication number
20070046920
Publication date
Mar 1, 2007
ASML NETHERLANDS B.V.
Hans Van Der Laan
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic apparatus and device manufacturing method
Publication number
20060033898
Publication date
Feb 16, 2006
ASML NETHERLANDS B.V.
Theodorus Petrus Maria Cadee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY