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Johannes Antonius Maria Van den Oetelaar
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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle microscope with vibration detection / correction
Patent number
9,875,879
Issue date
Jan 23, 2018
FEI Company
Jeroen De Boeij
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for electron tomography
Patent number
9,147,551
Issue date
Sep 29, 2015
FEI Company
Uwe Luecken
G01 - MEASURING TESTING
Information
Patent Grant
Drift control in a charged particle beam system
Patent number
8,618,478
Issue date
Dec 31, 2013
FEI Company
Casper Maria Smit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manipulator for rotating and translating a sample holder
Patent number
7,884,326
Issue date
Feb 8, 2011
FEI Company
Jeroen van de Water
G01 - MEASURING TESTING
Information
Patent Grant
Manipulator for rotating and translating a sample holder
Patent number
7,800,063
Issue date
Sep 21, 2010
FEI Company
Jeroen van de Water
Patents Applications
last 30 patents
Information
Patent Application
BETA TILT SAMPLE HOLDER
Publication number
20250112020
Publication date
Apr 3, 2025
FEI Company
Albert Visscher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THERMAL DRIFT CORRECTION BASED ON THERMAL MODELING
Publication number
20230184696
Publication date
Jun 15, 2023
FEI Company
Hugo VAN LEEUWEN
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION / CORRECTION
Publication number
20170125209
Publication date
May 4, 2017
FEI Company
Jeroen De Boeij
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Electron Tomography
Publication number
20150069231
Publication date
Mar 12, 2015
FEI Company
Uwe Luecken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DRIFT CONTROL IN A CHARGED PARTICLE BEAM SYSTEM
Publication number
20130200270
Publication date
Aug 8, 2013
FEI Company
Casper Maria Smit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MANIPULATOR FOR ROTATING AND TRANSLATING A SAMPLE HOLDER
Publication number
20080173813
Publication date
Jul 24, 2008
FEI Company
JEROEN VAN DE WATER
G01 - MEASURING TESTING