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Johannes Dingenus Dingemanse
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Nijmegen, NL
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Patents Grants
last 30 patents
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Patent Grant
Testing of circuits with multiple clock domains
Patent number
7,565,591
Issue date
Jul 21, 2009
NXP B.V.
Johannes Dingenus Dingemanse
G01 - MEASURING TESTING
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Patent Grant
Core test control
Patent number
6,061,284
Issue date
May 9, 2000
U.S. Philips Corporation
Johannes D. Dingemanse
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Testing of circuits with multiple clock domains
Publication number
20070186132
Publication date
Aug 9, 2007
Koninklijke Philips Electronics N.V.
Johannes Dingenus Dingemanse
G01 - MEASURING TESTING