Johannes Dingenus Dingemanse

Person

  • Nijmegen, NL

Patents Grantslast 30 patents

  • Information Patent Grant

    Testing of circuits with multiple clock domains

    • Patent number 7,565,591
    • Issue date Jul 21, 2009
    • NXP B.V.
    • Johannes Dingenus Dingemanse
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Core test control

    • Patent number 6,061,284
    • Issue date May 9, 2000
    • U.S. Philips Corporation
    • Johannes D. Dingemanse
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents