Johannes F. C. M. Verhoeven

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Contamination monitor for measuring a degree of contamination in an...
- Patent number 5,093,577
- Issue date Mar 3, 1992
- U.S. Philips Corporation
- Johannes A. de Poorter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Improved method of manufacturing a semiconductor device of the "sem...
- Patent number 4,971,925
- Issue date Nov 20, 1990
- U.S. Philips Corporation
- Elizabeth M. L. Alexander
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device having an SOI struct...
- Patent number 4,925,805
- Issue date May 15, 1990
- U.S. Philips Corporation
- Alfred H. van Ommen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a pattern of conductive material
- Patent number 4,590,093
- Issue date May 20, 1986
- U.S. Philips Corporation
- Pierre H. Woerlee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 4,292,642
- Issue date Sep 29, 1981
- U.S. Philips Corporation
- Johannes A. Appels
- H01 - BASIC ELECTRIC ELEMENTS