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Johannes G. Beha
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Wadenswil, CH
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last 30 patents
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Patent Grant
High-speed modular switching apparatus for circuit and packet switc...
Patent number
5,008,878
Issue date
Apr 16, 1991
International Business Machines Corporation
Hamid Ahmadi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for contactless testing of conducting paths in a substrate u...
Patent number
4,999,577
Issue date
Mar 12, 1991
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Method for investigating surfaces at nanometer and picosecond resol...
Patent number
4,918,309
Issue date
Apr 17, 1990
International Business Machines Corporation
Johannes G. Beha
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Full chip integrated circuit tester
Patent number
4,845,425
Issue date
Jul 4, 1989
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Method for contactless testing for electrical opens and short circu...
Patent number
4,843,329
Issue date
Jun 27, 1989
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Photon assisted tunneling testing of passivated integrated circuits
Patent number
4,786,864
Issue date
Nov 22, 1988
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Noncontact dynamic tester for integrated circuits
Patent number
4,706,018
Issue date
Nov 10, 1987
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Full chip integrated circuit tester
Patent number
4,703,260
Issue date
Oct 27, 1987
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Noncontact full-line dynamic AC tester for integrated circuits
Patent number
4,670,710
Issue date
Jun 2, 1987
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Photon assisted tunneling testing of passivated integrated circuits
Patent number
4,644,264
Issue date
Feb 17, 1987
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Buried junction Josephson interferometer
Patent number
4,525,730
Issue date
Jun 25, 1985
International Business Machines Corporation
Johannes G. Beha
H01 - BASIC ELECTRIC ELEMENTS