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Johannes Hendrik Pieter Machiel Kerkhof
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JD Rozenburg, NL
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last 30 patents
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Patent Grant
Apparatus and method for detecting undesired residues in a sample
Patent number
7,736,588
Issue date
Jun 15, 2010
DSM IP Assets B.V.
Pieter Cornelis Langeveld
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method to locate an object
Patent number
7,308,141
Issue date
Dec 11, 2007
DSM IP Assets B.V.
Pieter Cornelis Langeveld
G06 - COMPUTING CALCULATING COUNTING