Johannes Hendrik Pieter Machiel Kerkhof

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Jd Rozenburg, NL

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Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for detecting undesired residues in a sample
- Publication number 20050014281
- Publication date Jan 20, 2005
- Pieter Cornelis Langeveld
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method to locate an object
- Publication number 20040249835
- Publication date Dec 9, 2004
- Pieter Cornelis Langeveld
- G06 - COMPUTING CALCULATING COUNTING