Johannes Jacobus Lambertus Mulders

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Au-containing layer for charged particle beam processing
- Patent number 9,617,641
- Issue date Apr 11, 2017
- FEI Company
- Johannes Jacobus Lambertus Mulders
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged-particle microscope with Raman spectroscopy capability
- Patent number 9,406,482
- Issue date Aug 2, 2016
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING
Information Patent Grant
Low energy ion milling or deposition
- Patent number 9,206,504
- Issue date Dec 8, 2015
- FEI Company
- Johannes Jacobus Lambertus Mulders
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Forming a vitrified sample for electron microscopy
- Patent number 8,884,248
- Issue date Nov 11, 2014
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING
Information Patent Grant
Beam-induced deposition at cryogenic temperatures
- Patent number 8,796,646
- Issue date Aug 5, 2014
- FEI Company
- Johannes Jacobus Lambertus Mulders
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam processing
- Patent number 8,598,542
- Issue date Dec 3, 2013
- FEI Company
- Milos Toth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for forming microscopic 3D structures
- Patent number 8,597,565
- Issue date Dec 3, 2013
- FEI Company
- Jacob Simon Faber
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for obtaining images from slices of specimen
- Patent number 8,431,896
- Issue date Apr 30, 2013
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SIMS Spectrometry Technique
- Publication number 20190172696
- Publication date Jun 6, 2019
- FEI Company
- Johannes Jacobus Lambertus Mulders
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-SOURCE GIS FOR PARTICLE-OPTICAL APPARATUS
- Publication number 20160244871
- Publication date Aug 25, 2016
- FEI Company
- Johannes Jacobus Lambertus Mulders
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH RAMAN SPECTROSCOPY CAPABILITY
- Publication number 20150009489
- Publication date Jan 8, 2015
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING
Information Patent Application
Low Energy Ion Milling or Deposition
- Publication number 20140302252
- Publication date Oct 9, 2014
- FEI Company
- Johannes Jacobus Lambertus Mulders
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Forming a Vitrified Sample for Electron Microscopy
- Publication number 20130205808
- Publication date Aug 15, 2013
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING
Information Patent Application
Method for obtaining images from slices of specimen
- Publication number 20080088831
- Publication date Apr 17, 2008
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING

Johannes Jacobus Lambertus Mulders

Person

Patents Grantslast 30 patents

Au-containing layer for charged particle beam processing

Charged-particle microscope with Raman spectroscopy capability

Low energy ion milling or deposition

Forming a vitrified sample for electron microscopy

Beam-induced deposition at cryogenic temperatures

Charged particle beam processing

Method for forming microscopic 3D structures

Method for obtaining images from slices of specimen

Patents Applicationslast 30 patents

SIMS Spectrometry Technique

MULTI-SOURCE GIS FOR PARTICLE-OPTICAL APPARATUS

CHARGED-PARTICLE MICROSCOPE WITH RAMAN SPECTROSCOPY CAPABILITY

Low Energy Ion Milling or Deposition

Forming a Vitrified Sample for Electron Microscopy

Method for obtaining images from slices of specimen