Johannes K. Zettler

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining the layer thickness and the re...
- Patent number 8,233,158
- Issue date Jul 31, 2012
- Laytec Aktiengesellschaft
- Joerg-Thomas Zettler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Measuring the Thickness of a Transparent L...
- Publication number 20240027184
- Publication date Jan 25, 2024
- LayTec AG
- Joerg-Thomas Zettler
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THE LAYER THICKNESS AND THE RE...
- Publication number 20100290046
- Publication date Nov 18, 2010
- LayTec GmbH
- Joerg-Thomas ZETTLER
- G01 - MEASURING TESTING